Site-selective x-ray absorption fine structure analysis of an optically active center in Er-doped semiconductor thin film using x-ray-excited optical luminescence

Masashi Ishii; Yoshihito Tanaka; Tetsuya Ishikawa; Shuji Komuro; Takitaro Morikawa; Yoshinobu Aoyagi

doi:10.1063/1.1336546

Site-selective x-ray absorption fine structure analysis of an optically active center in Er-doped semiconductor thin film using x-ray-excited optical luminescence

Applied Physics Letters ◽

10.1063/1.1336546 ◽

2001 ◽

Vol 78 (2) ◽

pp. 183-185 ◽

Cited By ~ 27

Author(s):

Masashi Ishii ◽

Yoshihito Tanaka ◽

Tetsuya Ishikawa ◽

Shuji Komuro ◽

Takitaro Morikawa ◽

...

Keyword(s):

Thin Film ◽

Fine Structure ◽

Active Center ◽

Optically Active ◽

X Ray ◽

Optical Luminescence ◽

Semiconductor Thin Film ◽

Er Doped ◽

Site Selective ◽

X Ray Absorption

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X-ray-excited optical luminescence of erbium-doped semiconductor: site-selective X-ray absorption spectroscopy of an optically active atom

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(00)00237-1 ◽

2001 ◽

Vol 114-116 ◽

pp. 521-525 ◽

Cited By ~ 2

Author(s):

M. Ishii ◽

Y. Tanaka ◽

S. Komuro ◽

T. Morikawa ◽

Y. Aoyagi ◽

...

Keyword(s):

Absorption Spectroscopy ◽

Optically Active ◽

X Ray ◽

Active Atom ◽

Erbium Doped ◽

Optical Luminescence ◽

Site Selective ◽

X Ray Absorption

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32 X-ray absorption fine structure utilizing a fluorescence spectrometer: Site selective structure determination of environmental catalysts and adsorbents

Science and Technology in Catalysis 2002, Proceedings of the Fourth Tokyo conference on Advance Catalytic Science and Technology - Studies in Surface Science and Catalysis ◽

10.1016/s0167-2991(03)80189-1 ◽

2003 ◽

pp. 177-180

Author(s):

Yasuo Izumi ◽

Fumitaka Kiyotaki ◽

Hiroyasu Nagamori ◽

Taketoshi Minato

Keyword(s):

Fine Structure ◽

Structure Determination ◽

X Ray ◽

Absorption Fine ◽

Environmental Catalysts ◽

Site Selective ◽

Fluorescence Spectrometer ◽

X Ray Absorption

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X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVD

2016 5th International Symposium on Next-Generation Electronics (ISNE) ◽

10.1109/isne.2016.7543313 ◽

2016 ◽

Cited By ~ 1

Author(s):

Jieping Xin ◽

Chieh Miao Chang ◽

Chih-han Hsueh ◽

Jyh-Fu Lee ◽

Jin-Ming Chen ◽

...

Keyword(s):

Thin Film ◽

Fine Structure ◽

Zno Thin Film ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption

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Near-Edge X-ray Absorption Fine Structure of DNA Nucleobases Thin Film in the Nitrogen and Oxygen K-edge Region

The Journal of Physical Chemistry B ◽

10.1021/jp036872f ◽

2004 ◽

Vol 108 (23) ◽

pp. 8031-8035 ◽

Cited By ~ 44

Author(s):

K. Fujii ◽

K. Akamatsu ◽

A. Yokoya

Keyword(s):

Thin Film ◽

Fine Structure ◽

Edge Region ◽

X Ray ◽

Absorption Fine ◽

Dna Nucleobases ◽

X Ray Absorption

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X-ray induced photoemission of a localized electron and its application to site-selective x-ray absorption fine structure measurement

Journal of Applied Physics ◽

10.1063/1.1308098 ◽

2000 ◽

Vol 88 (7) ◽

pp. 3962 ◽

Cited By ~ 9

Author(s):

Masashi Ishii ◽

Yoko Yoshino ◽

Ken-ichi Takarabe ◽

Osamu Shimomura

Keyword(s):

Fine Structure ◽

X Ray ◽

Absorption Fine ◽

Site Selective ◽

X Ray Absorption ◽

Structure Measurement

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Pendant group orientation of poly(2-vinylnaphthalene) thin film surface studied by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS)

The Journal of Chemical Physics ◽

10.1063/1.481751 ◽

2000 ◽

Vol 112 (23) ◽

pp. 10476-10481 ◽

Cited By ~ 15

Author(s):

E. Morikawa ◽

V. Saile ◽

K. K. Okudaira ◽

Y. Azuma ◽

K. Meguro ◽

...

Keyword(s):

Thin Film ◽

Fine Structure ◽

Photoelectron Spectroscopy ◽

Film Surface ◽

Ultraviolet Photoelectron Spectroscopy ◽

Pendant Group ◽

X Ray ◽

Group Orientation ◽

Thin Film Surface ◽

X Ray Absorption

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Optical Properties and X-ray Absorption Fine Structure Analysis of ZnS:Cu,Cl Thin-Film Phosphors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.082602 ◽

2010 ◽

Vol 49 (8) ◽

pp. 082602 ◽

Cited By ~ 1

Author(s):

Kunio Ichino ◽

Haruki Kato ◽

Yuichiro Sakai ◽

Koutoku Ohmi ◽

Tetsuo Honma ◽

...

Keyword(s):

Thin Film ◽

Optical Properties ◽

Fine Structure ◽

Structure Analysis ◽

X Ray ◽

Absorption Fine ◽

Fine Structure Analysis ◽

X Ray Absorption

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The optically active center and its activation process in Er-doped Si thin film produced by laser ablation

Journal of Applied Physics ◽

10.1063/1.370306 ◽

1999 ◽

Vol 85 (8) ◽

pp. 4024-4031 ◽

Cited By ~ 41

Author(s):

Masashi Ishii ◽

Tetsuya Ishikawa ◽

Tatzuo Ueki ◽

Shuji Komuro ◽

Takitaro Morikawa ◽

...

Keyword(s):

Thin Film ◽

Laser Ablation ◽

Active Center ◽

Optically Active ◽

Activation Process ◽

Er Doped ◽

Si Thin Film

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Bayesian sparse modeling of extended x-ray absorption fine structure to determine interstitial oxygen positions in yttrium oxyhydride epitaxial thin film

AIP Advances ◽

10.1063/5.0071166 ◽

2021 ◽

Vol 11 (12) ◽

pp. 125013

Author(s):

Hiroyuki Kumazoe ◽

Yasuhiko Igarashi ◽

Fabio Iesari ◽

Ryota Shimizu ◽

Yuya Komatsu ◽

...

Keyword(s):

Thin Film ◽

Fine Structure ◽

Interstitial Oxygen ◽

Epitaxial Thin Film ◽

Sparse Modeling ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption

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Local structure analysis of an optically active center in Er-doped ZnO thin film

Journal of Applied Physics ◽

10.1063/1.1355284 ◽

2001 ◽

Vol 89 (7) ◽

pp. 3679-3684 ◽

Cited By ~ 104

Author(s):

Masashi Ishii ◽

Shuji Komuro ◽

Takitaro Morikawa ◽

Yoshinobu Aoyagi

Keyword(s):

Thin Film ◽

Active Center ◽

Structure Analysis ◽

Local Structure ◽

Optically Active ◽

Zno Thin Film ◽

Doped Zno ◽

Er Doped

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