X-ray induced photoemission of a localized electron and its application to site-selective x-ray absorption fine structure measurement

2000 ◽  
Vol 88 (7) ◽  
pp. 3962 ◽  
Author(s):  
Masashi Ishii ◽  
Yoko Yoshino ◽  
Ken-ichi Takarabe ◽  
Osamu Shimomura
Keyword(s):  
Fine Structure ◽  
X Ray ◽  
Absorption Fine ◽  
Site Selective ◽  
X Ray Absorption ◽  
Structure Measurement

Extended x-ray absorption fine structure measurement of phase transformation in iron shocked by nanosecond laser

2005 ◽  
Vol 12 (9) ◽  
pp. 092703 ◽  
Author(s):  
B. Yaakobi ◽  
T. R. Boehly ◽  
D. D. Meyerhofer ◽  
T. J. B. Collins ◽  
B. A. Remington ◽  
...  
Keyword(s):  
Phase Transformation ◽  
Fine Structure ◽  
Nanosecond Laser ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Structure Measurement

Site-selective x-ray absorption fine structure: Selective observation of Ga local structure in DX center of Al0.33Ga0.67As:Se

1999 ◽  
Vol 74 (18) ◽  
pp. 2672-2674 ◽  
Author(s):  
Masashi Ishii ◽  
Yoko Yoshino ◽  
Ken-ichi Takarabe ◽  
Osamu Shimomura
Keyword(s):  
Fine Structure ◽  
Local Structure ◽  
X Ray ◽  
Absorption Fine ◽  
Dx Center ◽  
Site Selective ◽  
X Ray Absorption

Study on the Surface Density of Surface-Active Substances through Total-Reflection X-ray Absorption Fine Structure Measurement

Langmuir ◽  
2006 ◽  
Vol 22 (20) ◽  
pp. 8403-8408 ◽  
Author(s):  
Kaoru Kashimoto ◽  
Youichi Takata ◽  
Takashi Matsuda ◽  
Norihiro Ikeda ◽  
Hiroki Matsubara ◽  
...  
Keyword(s):  
Fine Structure ◽  
Surface Density ◽  
Total Reflection ◽  
X Ray ◽  
Absorption Fine ◽  
Surface Active ◽  
X Ray Absorption ◽  
Structure Measurement ◽  
Active Substances

Near-Edge X-ray Absorption Fine Structure Spectra and Site-Selective Dissociation of Phenol

2014 ◽  
Vol 118 (9) ◽  
pp. 1601-1609 ◽  
Author(s):  
Yi-Shiue Lin ◽  
Kun-Ta Lu ◽  
Yuan T. Lee ◽  
Chien-Ming Tseng ◽  
Chi-Kung Ni ◽  
...  
Keyword(s):  
Fine Structure ◽  
X Ray ◽  
Absorption Fine ◽  
Selective Dissociation ◽  
Site Selective ◽  
X Ray Absorption

X-ray-absorption fine-structure measurement of single-crystal materials

1990 ◽  
Vol 42 (16) ◽  
pp. 10724-10726 ◽  
Author(s):  
K. H. Kim ◽  
W. T. Elam ◽  
E. F. Skelton ◽  
J. P. Kirkland ◽  
R. A. Neiser
Keyword(s):  
Fine Structure ◽  
Single Crystal ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Structure Measurement
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