Pendant group orientation of poly(2-vinylnaphthalene) thin film surface studied by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS)

E. Morikawa; V. Saile; K. K. Okudaira; Y. Azuma; K. Meguro; Y. Harada; K. Seki; S. Hasegawa; N. Ueno

doi:10.1063/1.481751

Pendant group orientation of poly(2-vinylnaphthalene) thin film surface studied by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS)

The Journal of Chemical Physics ◽

10.1063/1.481751 ◽

2000 ◽

Vol 112 (23) ◽

pp. 10476-10481 ◽

Cited By ~ 15

Author(s):

E. Morikawa ◽

V. Saile ◽

K. K. Okudaira ◽

Y. Azuma ◽

K. Meguro ◽

...

Keyword(s):

Thin Film ◽

Fine Structure ◽

Photoelectron Spectroscopy ◽

Film Surface ◽

Ultraviolet Photoelectron Spectroscopy ◽

Pendant Group ◽

X Ray ◽

Group Orientation ◽

Thin Film Surface ◽

X Ray Absorption

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Investigation of O2- and Air-Exposure Effects on Amorphous In–Ga–Zn–O Thin-Film Surface by X-ray Photoelectron Spectroscopy

Journal of Inorganic and Organometallic Polymers and Materials ◽

10.1007/s10904-013-9912-z ◽

2013 ◽

Vol 23 (6) ◽

pp. 1519-1523 ◽

Cited By ~ 3

Author(s):

Se Jun Kang ◽

Jaeyoon Baik ◽

Hyun-Joon Shin

Keyword(s):

Thin Film ◽

Photoelectron Spectroscopy ◽

Film Surface ◽

Air Exposure ◽

X Ray ◽

Thin Film Surface

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The influence of relative humidity upon Cu(In,Ga)Se2 thin-film surface chemistry: an X-ray photoelectron spectroscopy study

Applied Surface Science ◽

10.1016/j.apsusc.2021.151898 ◽

2021 ◽

pp. 151898

Author(s):

Solène Béchu ◽

Muriel Bouttemy ◽

Jean-François Guillemoles ◽

Arnaud Etcheberry

Keyword(s):

Thin Film ◽

Relative Humidity ◽

Surface Chemistry ◽

Photoelectron Spectroscopy ◽

Film Surface ◽

Spectroscopy Study ◽

X Ray ◽

Thin Film Surface

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Summary Abstract: Determination of bond orientation for CO on Mo(100) by using angle‐resolved ultraviolet photoelectron spectroscopy and near‐edge x‐ray absorption fine‐structure spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575060 ◽

1988 ◽

Vol 6 (3) ◽

pp. 875-876 ◽

Cited By ~ 4

Author(s):

F. Zaera ◽

J. P. Fulmer ◽

W. T. Tysoe

Keyword(s):

Fine Structure ◽

Photoelectron Spectroscopy ◽

Ultraviolet Photoelectron Spectroscopy ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption

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The application of Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy and X-ray Photoelectron Spectroscopy (XPS) in surface analysis of chromium-evaporated polymers and organic films

Metallized Plastics 5&6: Fundamental and Applied Aspects ◽

10.1201/b11958-21 ◽

1998 ◽

pp. 157-178

Keyword(s):

Fine Structure ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Organic Films ◽

X Ray ◽

Absorption Fine ◽

Nexafs Spectroscopy ◽

X Ray Absorption

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X-ray absorption fine structure and X-ray photoelectron spectroscopy studies of nanocomposite systems based on ZnS:Cu deposited into porous anodic Al2O3 matrices

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s1027451017040310 ◽

2017 ◽

Vol 11 (4) ◽

pp. 879-884

Author(s):

R. G. Valeev ◽

A. L. Trigub ◽

Ya. V. Zubavichus ◽

F. Z. Gil’mutdinov ◽

I. A. El’kin

Keyword(s):

Fine Structure ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Absorption Fine ◽

Spectroscopy Studies ◽

X Ray Absorption

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OXYGEN SUBSTITUTION IN SPUTTER-DEPOSITED MoS2 FILMS STUDIED BY EXTENDED X-RAY ABSORPTION FINE STRUCTURE, X-RAY PHOTOELECTRON SPECTROSCOPY AND X-RAY DIFFRACTION

Metallurgical Coatings and Thin Films 1990 ◽

10.1016/b978-1-85166-813-7.50068-1 ◽

1990 ◽

pp. 640-651

Author(s):

JEFFREY R. LINCE ◽

MICHAEL R. HILTON ◽

ARUN S. BOMMANNAVAR

Keyword(s):

Fine Structure ◽

Photoelectron Spectroscopy ◽

X Ray Diffraction ◽

X Ray ◽

Absorption Fine ◽

Sputter Deposited ◽

Oxygen Substitution ◽

X Ray Absorption

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A study of thin film Au–Al alloy oxidation in ambient air by X-ray photoelectron spectroscopy (XPS), X-ray absorption near edge structure (XANES), and secondary ion mass spectrometry (SIMS)

Applied Surface Science ◽

10.1016/s0169-4332(01)01038-8 ◽

2002 ◽

Vol 187 (3-4) ◽

pp. 266-274 ◽

Cited By ~ 16

Author(s):

H. Piao ◽

M. Suominen Fuller ◽

D. Miller ◽

N.S. McIntyre

Keyword(s):

Thin Film ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Ambient Air ◽

Al Alloy ◽

Edge Structure ◽

X Ray ◽

Alloy Oxidation ◽

X Ray Absorption ◽

Secondary Ion

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Synchrotron radiation photoelectron spectroscopy and near-edge X-ray absorption fine structure study on oxidative etching of diamond-like carbon films by hyperthermal atomic oxygen

Applied Surface Science ◽

10.1016/j.apsusc.2010.06.030 ◽

2010 ◽

Vol 256 (24) ◽

pp. 7678-7683 ◽

Cited By ~ 12

Author(s):

Masahito Tagawa ◽

Kumiko Yokota ◽

Akira Kitamura ◽

Koji Matsumoto ◽

Akitaka Yoshigoe ◽

...

Keyword(s):

Fine Structure ◽

Synchrotron Radiation ◽

Photoelectron Spectroscopy ◽

Atomic Oxygen ◽

Structure Study ◽

Carbon Films ◽

Diamond Like Carbon ◽

X Ray ◽

Oxidative Etching ◽

X Ray Absorption

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X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVD

2016 5th International Symposium on Next-Generation Electronics (ISNE) ◽

10.1109/isne.2016.7543313 ◽

2016 ◽

Cited By ~ 1

Author(s):

Jieping Xin ◽

Chieh Miao Chang ◽

Chih-han Hsueh ◽

Jyh-Fu Lee ◽

Jin-Ming Chen ◽

...

Keyword(s):

Thin Film ◽

Fine Structure ◽

Zno Thin Film ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption

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Near-Edge X-ray Absorption Fine Structure of DNA Nucleobases Thin Film in the Nitrogen and Oxygen K-edge Region

The Journal of Physical Chemistry B ◽

10.1021/jp036872f ◽

2004 ◽

Vol 108 (23) ◽

pp. 8031-8035 ◽

Cited By ~ 44

Author(s):

K. Fujii ◽

K. Akamatsu ◽

A. Yokoya

Keyword(s):

Thin Film ◽

Fine Structure ◽

Edge Region ◽

X Ray ◽

Absorption Fine ◽

Dna Nucleobases ◽

X Ray Absorption

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