scholarly journals Electron transport in silicon nanowires: The role of acoustic phonon confinement and surface roughness scattering

2008 ◽  
Vol 104 (6) ◽  
pp. 063711 ◽  
Author(s):  
E. B. Ramayya ◽  
D. Vasileska ◽  
S. M. Goodnick ◽  
I. Knezevic
Keyword(s):  
Surface Roughness ◽  
Electron Transport ◽  
Silicon Nanowires ◽  
Acoustic Phonon ◽  
Phonon Confinement ◽  
Surface Roughness Scattering

Surface roughness scattering model for arbitrarily oriented silicon nanowires

2011 ◽  
Vol 110 (8) ◽  
pp. 084514 ◽  
Author(s):  
Isabel M. Tienda-Luna ◽  
F. G. Ruiz ◽  
A. Godoy ◽  
B. Biel ◽  
F. Gámiz
Keyword(s):  
Surface Roughness ◽  
Silicon Nanowires ◽  
Scattering Model ◽  
Surface Roughness Scattering

Electron mobility in silicon nanowires using nonlinear surface roughness scattering model

2020 ◽  
Vol 59 (3) ◽  
pp. 034002 ◽  
Author(s):  
Jiahui Duan ◽  
Jinjuan Xiang ◽  
Lixing Zhou ◽  
Xiaolei Wang ◽  
Xueli Ma ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Silicon Nanowires ◽  
Electron Mobility ◽  
Scattering Model ◽  
Surface Roughness Scattering ◽  
Nonlinear Surface

Role of surface-roughness scattering in double gate silicon-on-insulator inversion layers

2001 ◽  
Vol 89 (3) ◽  
pp. 1764 ◽  
Author(s):  
F. Gámiz ◽  
J. B. Roldán ◽  
P. Cartujo-Cassinello ◽  
J. A. López-Villanueva ◽  
P. Cartujo
Keyword(s):  
Surface Roughness ◽  
Silicon On Insulator ◽  
Double Gate ◽  
Surface Roughness Scattering
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