Characterization of excimer-laser-annealed polycrystalline silicon films grown by ultrahigh-vacuum chemical vapor deposition

2000 ◽  
Vol 77 (16) ◽  
pp. 2521-2523 ◽  
Author(s):  
Ying-Chia Chen ◽  
YewChung Sermon Wu ◽  
I-Chung Tung ◽  
Chi-Wei Chao ◽  
Ming-Shiann Feng ◽  
...  
Sign in / Sign up

Export Citation Format

Share Document