Microscopic magnetization reversal in perpendicular anisotropy CoCr thin films

2000 ◽  
Vol 76 (5) ◽  
pp. 619-621 ◽  
Author(s):  
Gottfried Wastlbauer ◽  
George D. Skidmore ◽  
Chris Merton ◽  
Jake Schmidt ◽  
E. Dan Dahlberg ◽  
...  
1995 ◽  
Vol 19 (S_1_MORIS_94) ◽  
pp. S1_79-83 ◽  
Author(s):  
J. FERRE ◽  
V. GROLIER ◽  
A. KIRILYUK ◽  
J.P. JAMET ◽  
D. RENARD

1991 ◽  
Vol 15 (2) ◽  
pp. 93-96 ◽  
Author(s):  
O. Ishii ◽  
F. Yoshimura ◽  
S. Hirono

1998 ◽  
Vol 57 (23) ◽  
pp. 14990-14998 ◽  
Author(s):  
A. Khapikov ◽  
L. Uspenskaya ◽  
J. Ebothe ◽  
S. Vilain

2002 ◽  
Vol 721 ◽  
Author(s):  
M. L. Yan ◽  
N. Powers ◽  
D. J. Sellmyer

AbstractWe report the non-epitaxial growth of highly textured (001) CoPt:B2O3 nanocomposite thin films that are deposited directly on thermally-oxidized Si wafers. Multilayers of Co/Pt/Co/B2O3 are deposited followed by appropriate thermal processing. The as-deposited films are disordered fcc CoPt phase, and magnetically soft. After annealing, an (001) orientation of CoPt-ordered grains is developed. The texture development is dependent both on the total film thickness and the annealing process. Nearly perfect (001) texture can be obtained in films with thinner initial layer thicknesses. Strong perpendicular anisotropy is shown to be related to this (001) texture.


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