Change of the magnetization reversal mechanism of polycrystalline Ni-Co thin films

1998 ◽  
Vol 57 (23) ◽  
pp. 14990-14998 ◽  
Author(s):  
A. Khapikov ◽  
L. Uspenskaya ◽  
J. Ebothe ◽  
S. Vilain
1991 ◽  
Vol 15 (2) ◽  
pp. 93-96 ◽  
Author(s):  
O. Ishii ◽  
F. Yoshimura ◽  
S. Hirono

2014 ◽  
Vol 924 ◽  
pp. 141-151 ◽  
Author(s):  
Yu Rong An ◽  
Yue Li ◽  
Zhen Wang ◽  
Ya Lu Zuo ◽  
Li Xi

The magnetic FeCoGd thin films with various sputtering power from 10 to 30 W were fabricated on glass substrates by magnetron co-sputtering. The crystal structure of as-deposited FeCoGd thin films was investigated by X-ray diffraction. And an increasing trend of grain size with the increasing sputtering power was shown. When sputtering power is below 30 W, the films exhibited obviously in-plane uniaxial magnetic anisotropy, and the in-plane magnetic anisotropy field Hkdecreased with increasing deposition power. Moreover, good high frequency characteristics were obtained. The magnetization reversal mechanism has been investigated via the in-plane angular dependences of the magnetization and the coercivity. The experimental data points indicated that the magnetization reversal mechanism of FeCoGd film with in-plane uniaxial anisotropy is domain-wall depinning and coherent rotation when the applied field is close to the easy axis and hard axis, respectively. A spin reorientation transition phenomenon was observed when deposition power is larger than 30 W. A stripe domain structure for the sample with 30 W deposition power was developed due to a dominated perpendicular magnetic anisotropy.


1991 ◽  
Vol 6 (9) ◽  
pp. 730-736
Author(s):  
O. Ishii ◽  
F. Yoshimura ◽  
S. Hirono

2016 ◽  
Vol 408 ◽  
pp. 228-232 ◽  
Author(s):  
Yongmei Zhang ◽  
Xiaohong Li ◽  
Jingjing Jing ◽  
Xiangyi Zhang ◽  
Yuhong Zhao

Proceedings ◽  
2019 ◽  
Vol 26 (1) ◽  
pp. 32
Author(s):  
Paweł Sobieszczyk ◽  
Michał Krupiński ◽  
Piotr Zieliński ◽  
Marta Marszałek

Fabrication and modeling of patterned thin films with perpendicular. [...]


2010 ◽  
Vol 107 (1) ◽  
pp. 013904 ◽  
Author(s):  
M. Mathews ◽  
E. P. Houwman ◽  
H. Boschker ◽  
G. Rijnders ◽  
D. H. A. Blank

2017 ◽  
Vol 122 (12) ◽  
pp. 123906 ◽  
Author(s):  
C. Papusoi ◽  
S. Jain ◽  
H. Yuan ◽  
M. Desai ◽  
R. Acharya

Author(s):  
B. G. Demczyk

CoCr thin films have been of interest for a number of years due to their strong perpendicular anisotropy, favoring magnetization normal to the film plane. The microstructure and magnetic properties of CoCr films prepared by both rf and magnetron sputtering have been examined in detail. By comparison, however, relatively few systematic studies of the magnetic domain structure and its relation to the observed film microstructure have been reported. In addition, questions still remain as to the operative magnetization reversal mechanism in different film thickness regimes. In this work, the magnetic domain structure in magnetron sputtered Co-22 at.%Cr thin films of known microstructure were examined by Lorentz transmission electron microscopy. Additionally, domain nucleation studies were undertaken via in-situ heating experiments.It was found that the 50 nm thick films, which are comprised of columnar grains, display a “dot” type domain configuration (Figure 1d), characteristic of a perpendicular magnetization. The domain size was found to be on the order of a few structural columns in diameter.


2012 ◽  
Vol 520 (17) ◽  
pp. 5746-5751 ◽  
Author(s):  
S.J. Zhang ◽  
Jian-Guo Zheng ◽  
Z. Shi ◽  
S.M. Zhou ◽  
L. Sun ◽  
...  

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