Electrical characteristics of thin-film transistors using field-aided lateral crystallization

Seung-Ik Jun; Yong-Ho Yang; Jae-Bok Lee; Duck-Kyun Choi

doi:10.1063/1.124975

Electrical characteristics of thin-film transistors using field-aided lateral crystallization

Applied Physics Letters ◽

10.1063/1.124975 ◽

1999 ◽

Vol 75 (15) ◽

pp. 2235-2237 ◽

Cited By ~ 44

Author(s):

Seung-Ik Jun ◽

Yong-Ho Yang ◽

Jae-Bok Lee ◽

Duck-Kyun Choi

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Electrical Characteristics ◽

Lateral Crystallization

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Electrical characteristics of polycrystalline silicon thin film transistors using the Cu-field aided lateral crystallization process

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1491552 ◽

2002 ◽

Vol 20 (4) ◽

pp. 1427 ◽

Cited By ~ 1

Author(s):

Se-Youl Kwon ◽

Kyoung-Wan Park ◽

Jae-Bok Lee ◽

Duck-Kyun Choi

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Crystallization Process ◽

Electrical Characteristics ◽

Silicon Thin Film ◽

Lateral Crystallization

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Influences of directional crystallization using field aided lateral crystallization on the electrical characteristics of poly-Si thin film transistors

Thin Solid Films ◽

10.1016/s0040-6090(02)00133-5 ◽

2002 ◽

Vol 408 (1-2) ◽

pp. 240-244 ◽

Cited By ~ 5

Author(s):

Jae-Bok Lee ◽

Duck-Kyun Choi ◽

Yong-Ho Yang

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Electrical Characteristics ◽

Directional Crystallization ◽

Lateral Crystallization ◽

Si Thin Film

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Effects of Channel Width and NH[sub 3] Plasma Passivation on Electrical Characteristics of Polysilicon Thin-Film Transistors by Pattern-Dependent Metal-Induced Lateral Crystallization

Journal of The Electrochemical Society ◽

10.1149/1.1931473 ◽

2005 ◽

Vol 152 (7) ◽

pp. G545 ◽

Cited By ~ 10

Author(s):

Yung-Chun Wu ◽

Ting-Chang Chang ◽

Cheng-Wei Chou ◽

Yuan-Chun Wu ◽

Po-Tsun Liu ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Channel Width ◽

Electrical Characteristics ◽

Plasma Passivation ◽

Lateral Crystallization

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Contact resistance corrected-electrical characteristics with channel length effects in π-conjugated small-molecule benzanthracene organic thin film transistors

Synthetic Metals ◽

10.1016/j.synthmet.2020.116670 ◽

2021 ◽

Vol 273 ◽

pp. 116670

Author(s):

Ahmed Al-Ghamdi ◽

W. Boukhili ◽

S. Wageh

Keyword(s):

Thin Film ◽

Contact Resistance ◽

Small Molecule ◽

Thin Film Transistors ◽

Channel Length ◽

Organic Thin Film Transistors ◽

Electrical Characteristics ◽

Organic Thin Film ◽

Length Effects

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Temperature-dependent ambipolar electrical characteristics of pentacene-based thin-film transistors: The impact of opposite-sign charge carriers

Organic Electronics ◽

10.1016/j.orgel.2015.06.021 ◽

2015 ◽

Vol 25 ◽

pp. 74-78 ◽

Cited By ~ 1

Author(s):

Tsung-Jun Ho ◽

Horng-Long Cheng ◽

Liang-Yun Chiu ◽

Wei-Yang Chou ◽

Fu-Ching Tang

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Opposite Sign ◽

Charge Carriers ◽

Electrical Characteristics ◽

Temperature Dependent ◽

The Impact

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Effects of Polystyrene Gate Dielectrics with Various Molecular Weights on Electrical Characteristics of Pentacene Thin-Film Transistors

Molecular Crystals and Liquid Crystals ◽

10.1080/15421406.2014.933384 ◽

2014 ◽

Vol 598 (1) ◽

pp. 129-134 ◽

Cited By ~ 1

Author(s):

Sung Woo Lee ◽

Dong Wook Kim ◽

Hyunji Shin ◽

Jong Sun Choi ◽

Jin-Hyuk Bae ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Gate Dielectrics ◽

Electrical Characteristics ◽

Molecular Weights

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Thermal annealing effect on electrical characteristics of CuPc thin-film transistors on glass with ZrO2 as gate dielectric

2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) ◽

10.1109/edssc.2015.7285084 ◽

2015 ◽

Author(s):

W. M. Tang ◽

M. G. Helander ◽

J. Qiu ◽

M. T. Greiner ◽

Z. H. Lu ◽

...

Keyword(s):

Thin Film ◽

Thermal Annealing ◽

Thin Film Transistors ◽

Gate Dielectric ◽

Annealing Effect ◽

Electrical Characteristics

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Characterization of (100)-Dominantly Oriented Poly-Si Thin Film Transistors Using Multi-Line Beam Continuous-Wave Laser Lateral Crystallization

ECS Transactions ◽

10.1149/07510.0049ecst ◽

2016 ◽

Vol 75 (10) ◽

pp. 49-54

Author(s):

T. T. Nguyen ◽

M. Hiraiwa ◽

T. Hirata ◽

S.-I. Kuroki

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Continuous Wave ◽

Continuous Wave Laser ◽

Wave Laser ◽

Line Beam ◽

Lateral Crystallization ◽

Si Thin Film

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Dual-Functional Superoxide Precursor To Improve the Electrical Characteristics of Oxide Thin Film Transistors

ACS Applied Materials & Interfaces ◽

10.1021/acsami.8b16961 ◽

2018 ◽

Vol 10 (51) ◽

pp. 44554-44560 ◽

Cited By ~ 4

Author(s):

Tae Soo Jung ◽

Heesoo Lee ◽

Hee Jun Kim ◽

Jin Hyeok Lee ◽

Hyun Jae Kim

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Oxide Thin Film ◽

Electrical Characteristics ◽

Dual Functional

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Structural and Electrical Characteristics of Solution-processed Copper Oxide Films for Application in Thin-film Transistors

Sensors and Materials ◽

10.18494/sam.2019.2160 ◽

2019 ◽

Vol 31 (2) ◽

pp. 501 ◽

Cited By ~ 1

Author(s):

Heonju Lee ◽

Xue Zhang ◽

Eui-Jik Kim ◽

Jaehoon Park

Keyword(s):

Thin Film ◽

Copper Oxide ◽

Thin Film Transistors ◽

Oxide Films ◽

Electrical Characteristics ◽

Solution Processed

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