Control of liquid crystal alignment by polyimide surface modification using atomic force microscopy

1997 ◽  
Vol 71 (20) ◽  
pp. 2907-2909 ◽  
Author(s):  
A. J. Pidduck ◽  
S. D. Haslam ◽  
G. P. Bryan-Brown ◽  
R. Bannister ◽  
I. D. Kitely
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Liquid Crystal ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Atomic Force ◽  
Crystal Alignment

Atomic force microscopy studies of rubbed polyimide surfaces used for liquid crystal alignment

1996 ◽  
Vol 14 (3) ◽  
pp. 1723-1728 ◽  
Author(s):  
A. J. Pidduck ◽  
G. P. Bryan‐Brown ◽  
S. Haslam ◽  
R. Bannister ◽  
I. Kitely ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Atomic Force ◽  
Crystal Alignment

Nanoscale mapping of catalytic hotspots on Fe, N-modified HOPG by scanning electrochemical microscopy-atomic force microscopy

Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.

Annealing effects on the electrical conductivity of polymerized liquid crystalline 3,4-ethylenedioxythiophene derivatives

e-Polymers ◽  
2006 ◽  
Vol 6 (1) ◽  
Author(s):  
Noelle Wrubbel ◽  
Helmut Ritter ◽  
Knud Reuter ◽  
Alexander Karbach ◽  
Doris Drechsler
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Liquid Crystalline ◽  
Electrically Conductive ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Annealing Effects

Abstract3,4-Ethylenedioxythiophene derivatives with aromatic, in most cases mesogenic, side groups were synthesized and their liquid crystal behaviour was characterized. These monomers were polymerized oxidatively to charged, electrically conductive polythiophenes. X-ray and atomic force microscopy studies were performed. Films of theses polythiophenes achieved via in situ polymerization were prone to a significant increase of the conductivity by annealing.

Surface modification of MgO substrates from aqueous exposure: an atomic force microscopy study

1997 ◽  
Vol 292 (1-2) ◽  
pp. 96-102 ◽  
Author(s):  
S.A. Holt ◽  
C.F. Jones ◽  
G.S. Watson ◽  
A. Crossley ◽  
C. Johnston ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Rubbing-induced charge domains observed by electrostatic force microscopy: effect on liquid crystal alignment

2003 ◽  
Vol 30 (5) ◽  
pp. 591-598 ◽  
Author(s):  
I. H. Bechtold ◽  
M. P. De Santo ◽  
J. J. Bonvent ◽  
E. A. Oliveira ◽  
R. Barberi ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Crystal Alignment ◽  
Induced Charge

Effect of surface modification on interfacial nanobubble morphology and contact line tension

Soft Matter ◽  
2015 ◽  
Vol 11 (26) ◽  
pp. 5214-5223 ◽  
Author(s):  
Kaushik K. Rangharajan ◽  
Kwang J. Kwak ◽  
A. T. Conlisk ◽  
Yan Wu ◽  
Shaurya Prakash
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Contact Line ◽  
Line Tension ◽  
Surface Hydrophobicity ◽  
Saturation State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Effect Of Surface

Using tapping mode atomic force microscopy, changes to interfacial nanobubble morphology and associated characteristics are analyzed as a function of surface hydrophobicity and solvent–air saturation state.

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