Effect of surface modification on interfacial nanobubble morphology and contact line tension

Soft Matter ◽  
2015 ◽  
Vol 11 (26) ◽  
pp. 5214-5223 ◽  
Author(s):  
Kaushik K. Rangharajan ◽  
Kwang J. Kwak ◽  
A. T. Conlisk ◽  
Yan Wu ◽  
Shaurya Prakash
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Contact Line ◽  
Line Tension ◽  
Surface Hydrophobicity ◽  
Saturation State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Effect Of Surface

Using tapping mode atomic force microscopy, changes to interfacial nanobubble morphology and associated characteristics are analyzed as a function of surface hydrophobicity and solvent–air saturation state.

Structure and Interactions in Chitosan Composites

2016 ◽  
Vol 672 ◽  
pp. 257-260 ◽  
Author(s):  
Katarzyna Lewandowska ◽  
Alina Sionkowska ◽  
Gabriel Furtos ◽  
Sylwia Grabska ◽  
Matra Michalska
Keyword(s):  
Atomic Force Microscopy ◽  
Acetic Acid ◽  
Fourier Transform ◽  
Surface Modification ◽  
Infrared Spectroscopy ◽  
Force Microscopy ◽  
Chitosan Matrix ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Film Composites

In the present study, the results of Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM) studies of chitosan (Ch) with montmorillonite (MMT) or nanoclay are presented. MMT samples have been used without modification and after nanoclay surface modification. Composites of chitosan with montmorillonite samples were obtained by drop casting suspensions of montmorillonite (3% relative to chitosan) and polymer (2wt%) in 1% acetic acid. The FTIR spectra of film composites in the amide I, amide II bands and the hydroxyl stretching bands of chitosan have been analyzed. The homogeneity and morphology of chitosan composites were ascertained from tapping-mode atomic force microscopy. The obtained results suggested that there were interactions between chitosan and montmorillonite. The microstructure obtained by AFM microscopy for chitosan and its composites showed that particles are relatively well dispersed in the chitosan matrix.

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy

1997 ◽  
Vol 71 (18) ◽  
pp. 2632-2634 ◽  
Author(s):  
Tatsuya Miyatani ◽  
Miki Horii ◽  
Armin Rosa ◽  
Masamichi Fujihira ◽  
Othmar Marti
Keyword(s):  
Atomic Force Microscopy ◽  
Double Layer ◽  
Electrical Double Layer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode ◽  
Mode Atomic Force Microscopy

Torsional resonance mode atomic force microscopy in liquid with Lorentz force actuation

2013 ◽  
Vol 24 (30) ◽  
pp. 305702 ◽  
Author(s):  
Chih-Wen Yang ◽  
Ren-Feng Ding ◽  
Shih-Hsiu Lai ◽  
Hsien-Shun Liao ◽  
Wei-Chiao Lai ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Lorentz Force ◽  
Resonance Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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