Atomic force microscopy studies of rubbed polyimide surfaces used for liquid crystal alignment

1996 ◽  
Vol 14 (3) ◽  
pp. 1723-1728 ◽  
Author(s):  
A. J. Pidduck ◽  
G. P. Bryan‐Brown ◽  
S. Haslam ◽  
R. Bannister ◽  
I. Kitely ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Atomic Force ◽  
Crystal Alignment

Control of liquid crystal alignment by polyimide surface modification using atomic force microscopy

1997 ◽  
Vol 71 (20) ◽  
pp. 2907-2909 ◽  
Author(s):  
A. J. Pidduck ◽  
S. D. Haslam ◽  
G. P. Bryan-Brown ◽  
R. Bannister ◽  
I. D. Kitely
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Liquid Crystal ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Atomic Force ◽  
Crystal Alignment

Annealing effects on the electrical conductivity of polymerized liquid crystalline 3,4-ethylenedioxythiophene derivatives

e-Polymers ◽  
2006 ◽  
Vol 6 (1) ◽  
Author(s):  
Noelle Wrubbel ◽  
Helmut Ritter ◽  
Knud Reuter ◽  
Alexander Karbach ◽  
Doris Drechsler
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Liquid Crystalline ◽  
Electrically Conductive ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Annealing Effects

Abstract3,4-Ethylenedioxythiophene derivatives with aromatic, in most cases mesogenic, side groups were synthesized and their liquid crystal behaviour was characterized. These monomers were polymerized oxidatively to charged, electrically conductive polythiophenes. X-ray and atomic force microscopy studies were performed. Films of theses polythiophenes achieved via in situ polymerization were prone to a significant increase of the conductivity by annealing.

Rubbing-induced charge domains observed by electrostatic force microscopy: effect on liquid crystal alignment

2003 ◽  
Vol 30 (5) ◽  
pp. 591-598 ◽  
Author(s):  
I. H. Bechtold ◽  
M. P. De Santo ◽  
J. J. Bonvent ◽  
E. A. Oliveira ◽  
R. Barberi ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Crystal Alignment ◽  
Induced Charge

Cavity Morphology of Polymer Dispersed System Utilizing Atomic Force Microscopy

2001 ◽  
Vol 709 ◽  
Author(s):  
Adam K. Fontecchio ◽  
Gregory P. Crawford ◽  
David Content
Keyword(s):  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Liquid Crystal Polymer ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Polymer Dispersed Liquid Crystal ◽  
Atomic Force ◽  
Crystal Polymer ◽  
Polymer Dispersed ◽  
Polymer Alignment

ABSTRACTHolographically-formed Polymer Dispersed Liquid Crystal have been imaged using atomic force microscopy (AFM) tapping techniques to study the droplet cavity morphology. Reflection-mode Bragg gratings were created using a 532 nm beam expanded laser to holographically form a grating structure within the liquid crystal / polymer film. The films were removed from their glass substrates prior to imaging by an atomic force microscope, and the digital files were analyzed. The surface structure is not smooth, as anticipated, but contains cavities with a dimpled morphology. We report our investigations and analysis including AFM images, image analysis, and liquid crystal / polymer alignment considerations.

Mechanisms Of Liquid Crystal Alignment On Buffed Polyimide Surfaces

1994 ◽  
Vol 345 ◽  
Author(s):  
Hirotsugu Kikuchi ◽  
J. A. Logan ◽  
Do Y. Yoon
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystals ◽  
Amic Acid ◽  
Polymer Chains ◽  
Polymer Surfaces ◽  
Polyimide Films ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Smectic C ◽  
Crystal Alignment

AbstractThe surfaces of poly(amic acid) and cured polyimide films, subjected to different buffing and cure profiles, have been examined by atomic force microscopy (AFM). The ability of these buffed polymer surfaces to align nematic and chiral smectic C liquid crystals were also investigated. These studies show that the presence of microgrooves on buffed polymer surfaces are not necessary for alignment of liquid crystals. Rather, it is concluded that the liquid crystal alignment is mainly caused by the anisotropic intermolecular interactions between liquid crystal molecules and the polymer chains oriented by buffing. For the alignment of smectics, both the degree of order and mechanical properties of polyimide films are found to be important factors.

Study of Liquid Crystal Prewetting Films by Atomic Force Microscopy in Tapping Mode

Langmuir ◽  
1998 ◽  
Vol 14 (10) ◽  
pp. 2916-2924 ◽  
Author(s):  
Sébastien Bardon ◽  
Marie Pierre Valignat ◽  
Anne Marie Cazabat ◽  
Wolfgang Stocker ◽  
Jürgen P. Rabe
Keyword(s):  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force
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