Observation and surface modification of electropolymerized poly(N-methylpyrrole) using atomic force microscopy

1994 ◽  
Vol 12 (3) ◽  
pp. 1596 ◽  
Author(s):  
T. Yano
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Force Microscopy ◽  
Atomic Force

Nanoscale mapping of catalytic hotspots on Fe, N-modified HOPG by scanning electrochemical microscopy-atomic force microscopy

Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.

Surface modification of MgO substrates from aqueous exposure: an atomic force microscopy study

1997 ◽  
Vol 292 (1-2) ◽  
pp. 96-102 ◽  
Author(s):  
S.A. Holt ◽  
C.F. Jones ◽  
G.S. Watson ◽  
A. Crossley ◽  
C. Johnston ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Effect of surface modification on interfacial nanobubble morphology and contact line tension

Soft Matter ◽  
2015 ◽  
Vol 11 (26) ◽  
pp. 5214-5223 ◽  
Author(s):  
Kaushik K. Rangharajan ◽  
Kwang J. Kwak ◽  
A. T. Conlisk ◽  
Yan Wu ◽  
Shaurya Prakash
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Contact Line ◽  
Line Tension ◽  
Surface Hydrophobicity ◽  
Saturation State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Effect Of Surface

Using tapping mode atomic force microscopy, changes to interfacial nanobubble morphology and associated characteristics are analyzed as a function of surface hydrophobicity and solvent–air saturation state.

Control of liquid crystal alignment by polyimide surface modification using atomic force microscopy

1997 ◽  
Vol 71 (20) ◽  
pp. 2907-2909 ◽  
Author(s):  
A. J. Pidduck ◽  
S. D. Haslam ◽  
G. P. Bryan-Brown ◽  
R. Bannister ◽  
I. D. Kitely
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Liquid Crystal ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Atomic Force ◽  
Crystal Alignment

Structure and Interactions in Chitosan Composites

2016 ◽  
Vol 672 ◽  
pp. 257-260 ◽  
Author(s):  
Katarzyna Lewandowska ◽  
Alina Sionkowska ◽  
Gabriel Furtos ◽  
Sylwia Grabska ◽  
Matra Michalska
Keyword(s):  
Atomic Force Microscopy ◽  
Acetic Acid ◽  
Fourier Transform ◽  
Surface Modification ◽  
Infrared Spectroscopy ◽  
Force Microscopy ◽  
Chitosan Matrix ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Film Composites

In the present study, the results of Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM) studies of chitosan (Ch) with montmorillonite (MMT) or nanoclay are presented. MMT samples have been used without modification and after nanoclay surface modification. Composites of chitosan with montmorillonite samples were obtained by drop casting suspensions of montmorillonite (3% relative to chitosan) and polymer (2wt%) in 1% acetic acid. The FTIR spectra of film composites in the amide I, amide II bands and the hydroxyl stretching bands of chitosan have been analyzed. The homogeneity and morphology of chitosan composites were ascertained from tapping-mode atomic force microscopy. The obtained results suggested that there were interactions between chitosan and montmorillonite. The microstructure obtained by AFM microscopy for chitosan and its composites showed that particles are relatively well dispersed in the chitosan matrix.

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