Construction of a dual mode scanning near-field optical microscope based on a tapping mode atomic force microscope

1998 ◽  
Vol 69 (11) ◽  
pp. 3840-3842 ◽  
Author(s):  
H.-N. Lin ◽  
S. H. Chen ◽  
L. J. Lee ◽  
Din Ping Tsai
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Optical Microscope ◽  
Dual Mode ◽  
Tapping Mode ◽  
Atomic Force

Tapping mode atomic force microscope combined with reflection scanning near-field optical microscope (AF/RSNOM)

2006 ◽  
Vol 258 (2) ◽  
pp. 275-279 ◽  
Author(s):  
Yinli Li ◽  
Shifa Wu ◽  
Pengfei Li ◽  
Jian Zhang ◽  
Shi Pan
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Optical Microscope ◽  
Tapping Mode ◽  
Atomic Force

scholarly journals Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor

Nanomaterials ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 1792
Author(s):  
Matityahu Karelits ◽  
Emanuel Lozitsky ◽  
Avraham Chelly ◽  
Zeev Zalevsky ◽  
Avi Karsenty
Keyword(s):  
Surface Characterization ◽  
Near Field ◽  
Optical Microscope ◽  
Dual Mode ◽  
Atomic Force ◽  
Reflected Light ◽  
Afm Imaging ◽  
Silicon Cantilever ◽  
Afm Cantilever ◽  
Silicon Based

A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photodetector consists of a platinum–silicon truncated conical photodetector sharing a subwavelength aperture, and processing uses advanced nanotechnology tools on a commercial silicon cantilever. Such a combined device enables a dual-mode usage of both AFM and NSOM measurements when collecting the reflected light directly from the scanned surface, while having a more efficient light collection process. In addition to its quite simple fabrication process, it is demonstrated that the AFM tip on which the photodetector is processed remains operational (i.e., the AFM imaging capability is not altered by the process). The AFM–NSOM capability of the processed tip is presented, and preliminary results show that AFM capability is not significantly affected and there is an improvement in surface characterization in the scanning proof of concept.

Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7635-7639 ◽  
Author(s):  
JunHo Kim ◽  
Jeongyong Kim ◽  
K.-B. Song ◽  
S.-Q. Lee ◽  
E.-K. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Study ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force

Heat Transfer Spectroscopy and “Heat Transfer-Distance” Curves

2008 ◽  
Author(s):  
Arvind Narayanaswamy ◽  
Sheng Shen ◽  
Gang Chen
Keyword(s):  
Heat Transfer ◽  
Radiative Transfer ◽  
Atomic Force Microscope ◽  
Near Field ◽  
Surface Force ◽  
Casimir Forces ◽  
Distance Curve ◽  
Transfer Distance ◽  
Atomic Force ◽  
Order Of Magnitude

Thermal radiative transfer between objects as well as near-field forces such as van der Waals or Casimir forces have their origins in the fluctuations of the electrodynamic field. Near-field radiative transfer between two objects can be enhanced by a few order of magnitude compared to the far-field radiative transfer that can be described by Planck’s theory of blackbody radiation and Kirchoff’s laws. Despite this common origin, experimental techniques of measuring near-field forces (using the surface force apparatus and the atomic force microscope) are more sophisticated than techniques of measuring near-field radiative transfer. In this work, we present an ultra-sensitive experimental technique of measuring near-field using a bi-material atomic force microscope cantilever as the thermal sensor. Just as measurements of near-field forces results in a “force distance curve”, measurement of near-field radiative transfer results in a “heat transfer-distance” curve. Results from the measurement of near-field radiative transfer will be presented.

Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

2013 ◽  
Author(s):  
Sangmin An ◽  
Corey Stambaugh ◽  
Soyoung Kwon ◽  
Kunyoung Lee ◽  
Bongsu Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Optical Microscope ◽  
Atomic Force
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