Scanning near‐field optical microscope using an atomic force microscope cantilever with integrated photodiode

1996 ◽  
Vol 68 (5) ◽  
pp. 579-581 ◽  
Author(s):  
S. Akamine ◽  
H. Kuwano ◽  
H. Yamada
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force Microscope Cantilever ◽  
Atomic Force ◽  
Force Microscope Cantilever

Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7635-7639 ◽  
Author(s):  
JunHo Kim ◽  
Jeongyong Kim ◽  
K.-B. Song ◽  
S.-Q. Lee ◽  
E.-K. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Study ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force
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