Tapping mode atomic force microscope combined with reflection scanning near-field optical microscope (AF/RSNOM)

2006 ◽  
Vol 258 (2) ◽  
pp. 275-279 ◽  
Author(s):  
Yinli Li ◽  
Shifa Wu ◽  
Pengfei Li ◽  
Jian Zhang ◽  
Shi Pan
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Optical Microscope ◽  
Tapping Mode ◽  
Atomic Force

Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7635-7639 ◽  
Author(s):  
JunHo Kim ◽  
Jeongyong Kim ◽  
K.-B. Song ◽  
S.-Q. Lee ◽  
E.-K. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Study ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force

Heat Transfer Spectroscopy and “Heat Transfer-Distance” Curves

2008 ◽  
Author(s):  
Arvind Narayanaswamy ◽  
Sheng Shen ◽  
Gang Chen
Keyword(s):  
Heat Transfer ◽  
Radiative Transfer ◽  
Atomic Force Microscope ◽  
Near Field ◽  
Surface Force ◽  
Casimir Forces ◽  
Distance Curve ◽  
Transfer Distance ◽  
Atomic Force ◽  
Order Of Magnitude

Thermal radiative transfer between objects as well as near-field forces such as van der Waals or Casimir forces have their origins in the fluctuations of the electrodynamic field. Near-field radiative transfer between two objects can be enhanced by a few order of magnitude compared to the far-field radiative transfer that can be described by Planck’s theory of blackbody radiation and Kirchoff’s laws. Despite this common origin, experimental techniques of measuring near-field forces (using the surface force apparatus and the atomic force microscope) are more sophisticated than techniques of measuring near-field radiative transfer. In this work, we present an ultra-sensitive experimental technique of measuring near-field using a bi-material atomic force microscope cantilever as the thermal sensor. Just as measurements of near-field forces results in a “force distance curve”, measurement of near-field radiative transfer results in a “heat transfer-distance” curve. Results from the measurement of near-field radiative transfer will be presented.

Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

2013 ◽  
Author(s):  
Sangmin An ◽  
Corey Stambaugh ◽  
Soyoung Kwon ◽  
Kunyoung Lee ◽  
Bongsu Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Optical Microscope ◽  
Atomic Force

scholarly journals Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

2019 ◽  
Vol 86 (s1) ◽  
pp. 12-16
Author(s):  
Janik Schaude ◽  
Julius Albrecht ◽  
Ute Klöpzig ◽  
Andreas C. Gröschl ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Metrological Traceability ◽  
Step Height ◽  
Tapping Mode ◽  
Atomic Force ◽  
In Situ Calibration ◽  
Measuring Machine ◽  
Piezoresistive Cantilevers

AbstractThis article presents a new tilting atomic force microscope (AFM) with an adjustable probe direction and piezoresistive cantilever operated in tapping-mode. The AFM is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The whole setup is integrated into a nano measuring machine (NMM-1) and the metrological traceability of the piezoresistive cantilever is warranted by in situ calibration on the NMM-1. To demonstrate the capabilities of the tilting AFM, measurements were conducted on a step height standard.

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