Simulation of near-field optical manipulator using the combination of a near-field scanning optical microscope probe and an atomic force microscope metallic probe

2011 ◽  
Vol 109 (10) ◽  
pp. 104317 ◽  
Author(s):  
Binghui Liu ◽  
Lijun Yang ◽  
Yang Wang
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force ◽  
Near Field Scanning ◽  
Microscope Probe

Near-field scanning optical microscope probe analysis

2008 ◽  
Vol 108 (7) ◽  
pp. 671-676 ◽  
Author(s):  
Petr Klapetek ◽  
Jiří Buršík ◽  
Miroslav Valtr ◽  
Jan Martinek
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Probe Analysis ◽  
Near Field Scanning ◽  
Microscope Probe

Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7635-7639 ◽  
Author(s):  
JunHo Kim ◽  
Jeongyong Kim ◽  
K.-B. Song ◽  
S.-Q. Lee ◽  
E.-K. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Study ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force

Atomic-force-regulated near-field scanning optical microscope

1992 ◽  
Author(s):  
Ricardo Toledo-Crow ◽  
Yue Chen ◽  
Mehdi Vaez-Iravani
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Atomic Force ◽  
Near Field Scanning

The height regulation of a near-field scanning optical microscope probe tip

1999 ◽  
Vol 194 (2-3) ◽  
pp. 317-320
Author(s):  
Wang ◽  
Wang ◽  
Jin ◽  
Huang ◽  
Xu
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Near Field Scanning ◽  
Microscope Probe

Fibre-top atomic force microscope probe with optical near-field detection capabilities

2010 ◽  
Vol 242 (1) ◽  
pp. 10-14 ◽  
Author(s):  
B. TIRIBILLI ◽  
G. MARGHERI ◽  
P. BASCHIERI ◽  
C. MENOZZI ◽  
D. CHAVAN ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Atomic Force Microscope Probe ◽  
Field Detection ◽  
Atomic Force ◽  
Detection Capabilities ◽  
Microscope Probe
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