scholarly journals A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

1998 ◽  
Vol 69 (8) ◽  
pp. 2964-2973 ◽  
Author(s):  
T. Warwick ◽  
K. Franck ◽  
J. B. Kortright ◽  
G. Meigs ◽  
M. Moronne ◽  
...  
Keyword(s):  
Light Source ◽  
Materials Science ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

Control and acquisition systems for new scanning transmission x-ray microscopes at Advanced Light Source (abstract)

2002 ◽  
Vol 73 (3) ◽  
pp. 1591-1591 ◽  
Author(s):  
T. Tyliszczak ◽  
P. Hitchcock ◽  
A. L. D. Kilcoyne ◽  
H. Ade ◽  
A. P. Hitchcock ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

scholarly journals A new bend-magnet beamline for scanning transmission X-ray microscopy at the Advanced Light Source

2002 ◽  
Vol 9 (4) ◽  
pp. 254-257 ◽  
Author(s):  
Tony Warwick ◽  
Harald Ade ◽  
David Kilcoyne ◽  
Michael Kritscher ◽  
Tolek Tylisczcak ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

scholarly journals Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source

2003 ◽  
Vol 10 (2) ◽  
pp. 125-136 ◽  
Author(s):  
A. L. D. Kilcoyne ◽  
T. Tyliszczak ◽  
W. F. Steele ◽  
S. Fakra ◽  
P. Hitchcock ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

scholarly journals Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source

1997 ◽  
Vol 84 (1-3) ◽  
pp. 85-98 ◽  
Author(s):  
Tony Warwick ◽  
Harald Ade ◽  
Adam P Hitchcock ◽  
Howard Padmore ◽  
Ed.G Rightor ◽  
...  
Keyword(s):  
Light Source ◽  
Materials Science ◽  
X Ray ◽  
Advanced Light Source

The Fluorescence X-Ray Microprobe at the Advanced Light Source

1996 ◽  
Vol 437 ◽  
Author(s):  
Albert C. Thompson ◽  
Karen Chapman
Keyword(s):  
Light Source ◽  
Materials Science ◽  
High Spatial Resolution ◽  
Multilayer Coating ◽  
Spot Size ◽  
Liner Material ◽  
X Ray ◽  
Minimal Sample ◽  
Advanced Light Source ◽  
Sample Damage

AbstractThe fluorescence x-ray microprobe beamline at the Advanced Light Source (ALS) provides a technique to study almost any sample with excellent trace element sensitivity, high spatial resolution and minimal sample damage. During the last two years, the focused spot size has been improved from 2 μm × 4 μm to 1.6 μm × 1 μm using a pair of elliptically-bent multilayer mirrors. Two sets of mirrors have been produced for operation at 8.5 keV and 12.5 keV with a bandpass (ΔE/E) of 4 %. The intensity has also increased by a factor of 20 to over 1 × 1010 photons/sec by linearly grading the multilayer coating on the mirrors and by operation of the ALS at 1.9 GeV rather than 1.5 GeV.A wide variety of samples have been studied. Some of the materials science samples that have been studied include gallium nitride samples, polycrystalline silicon solar cells, the liner material of a rocket motor and the central germanium core of an optical fiber.

scholarly journals Scanning transmission X-ray microscopy at a bending magnet beamline at the Advanced Light Source

2003 ◽  
Vol 104 ◽  
pp. 3-8 ◽  
Author(s):  
H. Ade ◽  
A. L.D. Kilcoyne ◽  
T. Tyliszczak ◽  
P. Hitchcock ◽  
E. Anderson ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities

2004 ◽  
Vol 10 (S02) ◽  
pp. 1018-1019 ◽  
Author(s):  
Tolek Tyliszczak ◽  
A. L. David Kilcoyne ◽  
J. Alexander Liddle ◽  
Tony Warwick ◽  
Adam P. Hitchcock ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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