The Fluorescence X-Ray Microprobe at the Advanced Light Source

1996 ◽  
Vol 437 ◽  
Author(s):  
Albert C. Thompson ◽  
Karen Chapman
Keyword(s):  
Light Source ◽  
Materials Science ◽  
High Spatial Resolution ◽  
Multilayer Coating ◽  
Spot Size ◽  
Liner Material ◽  
X Ray ◽  
Minimal Sample ◽  
Advanced Light Source ◽  
Sample Damage

AbstractThe fluorescence x-ray microprobe beamline at the Advanced Light Source (ALS) provides a technique to study almost any sample with excellent trace element sensitivity, high spatial resolution and minimal sample damage. During the last two years, the focused spot size has been improved from 2 μm × 4 μm to 1.6 μm × 1 μm using a pair of elliptically-bent multilayer mirrors. Two sets of mirrors have been produced for operation at 8.5 keV and 12.5 keV with a bandpass (ΔE/E) of 4 %. The intensity has also increased by a factor of 20 to over 1 × 1010 photons/sec by linearly grading the multilayer coating on the mirrors and by operation of the ALS at 1.9 GeV rather than 1.5 GeV.A wide variety of samples have been studied. Some of the materials science samples that have been studied include gallium nitride samples, polycrystalline silicon solar cells, the liner material of a rocket motor and the central germanium core of an optical fiber.

scholarly journals Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source

1997 ◽  
Vol 84 (1-3) ◽  
pp. 85-98 ◽  
Author(s):  
Tony Warwick ◽  
Harald Ade ◽  
Adam P Hitchcock ◽  
Howard Padmore ◽  
Ed.G Rightor ◽  
...  
Keyword(s):  
Light Source ◽  
Materials Science ◽  
X Ray ◽  
Advanced Light Source

scholarly journals A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

1998 ◽  
Vol 69 (8) ◽  
pp. 2964-2973 ◽  
Author(s):  
T. Warwick ◽  
K. Franck ◽  
J. B. Kortright ◽  
G. Meigs ◽  
M. Moronne ◽  
...  
Keyword(s):  
Light Source ◽  
Materials Science ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

scholarly journals Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

1998 ◽  
Vol 5 (3) ◽  
pp. 1090-1092 ◽  
Author(s):  
T. Warwick ◽  
H. Ade ◽  
S. Cerasari ◽  
J. Denlinger ◽  
K. Franck ◽  
...  
Keyword(s):  
Light Source ◽  
Atmospheric Pressure ◽  
Spectroscopic Analysis ◽  
Materials Science ◽  
Zone Plate ◽  
X Ray ◽  
Advanced Light Source

The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

X-ray microscopy by phase-retrieval methods at the advanced light source

2003 ◽  
Vol 104 ◽  
pp. 557-561 ◽  
Author(s):  
M. R. Howells ◽  
H. Chapman ◽  
S. Hau-Riege ◽  
H. He ◽  
S. Marchesini ◽  
...  
Keyword(s):  
Light Source ◽  
Phase Retrieval ◽  
X Ray ◽  
Advanced Light Source

scholarly journals X-Ray Diffraction under Extreme Conditions at the Advanced Light Source

2018 ◽  
Vol 2 (1) ◽  
pp. 4 ◽  
Author(s):  
Camelia Stan ◽  
Christine Beavers ◽  
Martin Kunz ◽  
Nobumichi Tamura
Keyword(s):  
Light Source ◽  
Extreme Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Advanced Light Source

scholarly journals Synchrotron X-Ray Microdiffraction Studies of Electromigration in Interconnect lines at the Advanced Light Source

2009 ◽  
Author(s):  
N. Tamura ◽  
K. Chen ◽  
M. Kunz ◽  
Paul S. Ho ◽  
Ehrenfried Zschech ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Interconnect Lines

Control and acquisition systems for new scanning transmission x-ray microscopes at Advanced Light Source (abstract)

2002 ◽  
Vol 73 (3) ◽  
pp. 1591-1591 ◽  
Author(s):  
T. Tyliszczak ◽  
P. Hitchcock ◽  
A. L. D. Kilcoyne ◽  
H. Ade ◽  
A. P. Hitchcock ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

scholarly journals A new bend-magnet beamline for scanning transmission X-ray microscopy at the Advanced Light Source

2002 ◽  
Vol 9 (4) ◽  
pp. 254-257 ◽  
Author(s):  
Tony Warwick ◽  
Harald Ade ◽  
David Kilcoyne ◽  
Michael Kritscher ◽  
Tolek Tylisczcak ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Scanning Transmission

scholarly journals Elucidating Chemical Structure at Station 11.3.1 at the Advanced Light Source

2014 ◽  
Vol 70 (a1) ◽  
pp. C1696-C1696
Author(s):  
Kevin Gagnon ◽  
Christine Beavers ◽  
Gregory Morrison ◽  
James Nasiatka ◽  
Simon Teat
Keyword(s):  
Light Source ◽  
Gas Flow ◽  
Structural Information ◽  
Spot Size ◽  
Complex Compounds ◽  
High Flux ◽  
Advanced Light Source ◽  
Recent Developments ◽  
Diamond Anvil ◽  
Focused Beam

One of the greatest challenges facing crystallographers has always been how to collect good data. This has become especially challenging as chemists are creating more complex compounds and looking to extract new exotic structural information from crystals which are getting smaller and smaller. Often, these crystals produce little or no diffraction on a laboratory diffractometer with long exposures. The past two decades have provided world-class synchrotron facilities to help solve these problems through a combination of high flux and a small focused beam spot size. Station 11.3.1 at the Advanced Light Source is a dedicated chemical crystallography beamline which has been developed and improved over the last decade to provide a global user base with a high flux, focused beam which is capable of doing more than just providing excellent data on weakly diffracting samples. Recent developments on station 11.3.1 include an environmental gas cell for studying of samples under evacuation, up to 1 atm of gasses and mixtures of gasses, and under gas flow; a diamond anvil cell for studying samples under applied pressures up to 10 GPa, a photodiode array for in-situ photocrystallography, as well as a tunable monochromator allowing energies between 6.5 and 22 keV. This poster will showcase the recent changes to station 11.3.1 as well as the future plans for upgrades.

scholarly journals Photoelectron and X-ray Absorption Spectroscopy of Pu

2003 ◽  
Vol 802 ◽  
Author(s):  
J. G. Tobin ◽  
B. Chung ◽  
R. K. Schulze ◽  
J. D. Farr ◽  
D. K. Shuh
Keyword(s):  
Light Source ◽  
Absorption Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Future Studies ◽  
X Ray ◽  
Advanced Light Source ◽  
First Results ◽  
X Ray Absorption

ABSTRACTWe have performed Photoelectron Spectroscopy and X-Ray Absorption Spectroscopy upon highly radioactive samples of Plutonium at the Advanced Light Source in Berkeley, CA, USA. First results from alpha and delta Plutonium are reported as well as plans for future studies of actinide studies.

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