Soft X-ray Scanning Transmission Microscope Working in an Extended Energy Range at the Advanced Light Source

Author(s):  
T. Tyliszczak
2002 ◽  
Vol 73 (3) ◽  
pp. 1591-1591 ◽  
Author(s):  
T. Tyliszczak ◽  
P. Hitchcock ◽  
A. L. D. Kilcoyne ◽  
H. Ade ◽  
A. P. Hitchcock ◽  
...  

2002 ◽  
Vol 9 (4) ◽  
pp. 254-257 ◽  
Author(s):  
Tony Warwick ◽  
Harald Ade ◽  
David Kilcoyne ◽  
Michael Kritscher ◽  
Tolek Tylisczcak ◽  
...  

2018 ◽  
Vol 25 (3) ◽  
pp. 878-884 ◽  
Author(s):  
Hyun-Joon Shin ◽  
Namdong Kim ◽  
Hee-Seob Kim ◽  
Wol-Woo Lee ◽  
Chae-Soon Lee ◽  
...  

A scanning transmission X-ray microscope is operational at the 10A beamline at the Pohang Light Source. The 10A beamline provides soft X-rays in the photon energy range 100–2000 eV using an elliptically polarized undulator. The practically usable photon energy range of the scanning transmission X-ray microscopy (STXM) setup is from ∼150 to ∼1600 eV. With a zone plate of 25 nm outermost zone width, the diffraction-limited space resolution, ∼30 nm, is achieved in the photon energy range up to ∼850 eV. In transmission mode for thin samples, STXM provides the element, chemical state and magnetic moment specific distributions, based on absorption spectroscopy. A soft X-ray fluorescence measurement setup has been implemented in order to provide the elemental distribution of thicker samples as well as chemical state information with a space resolution of ∼50 nm. A ptychography setup has been implemented in order to improve the space resolution down to 10 nm. Hardware setups and application activities of the STXM are presented.


2003 ◽  
Vol 10 (2) ◽  
pp. 125-136 ◽  
Author(s):  
A. L. D. Kilcoyne ◽  
T. Tyliszczak ◽  
W. F. Steele ◽  
S. Fakra ◽  
P. Hitchcock ◽  
...  

Author(s):  
W. Meyer-Ilse ◽  
H. Medecki ◽  
C Magowan ◽  
R. Balhorn ◽  
M. Moronne ◽  
...  

A new x-ray microscope (XM-1) has been installed at the Advanced Light Source in Berkeley. This transmission microscope uses zone-plates for a resolution exceeding visible light microscopies. Samples can be as thick as 10 microns, for wet or dry specimens. These features make x-ray microscopy a valuable complement to other advanced techniques.There are two types of x-ray microscopes, scanning and conventional (imaging) microscopes. The scanning type minimizes radiation dose to the sample and is convenient for high resolution use of fluorescent labels; however, it requires a spatially coherent x-ray source and as a result involves long exposure times. The conventional type provides a higher potential for ultimate resolution as there is no scanning stage needed, and it can operate with an incoherent light source. It therefore has a shorter exposure time, but does require a higher radiation dose due to lens inefficiencies. The new XM-1 is of the second type. Its optical layout is very similar to the Gottingen x-ray microscope operated at the BESSY facility in Berlin, Germany.


1998 ◽  
Vol 69 (8) ◽  
pp. 2964-2973 ◽  
Author(s):  
T. Warwick ◽  
K. Franck ◽  
J. B. Kortright ◽  
G. Meigs ◽  
M. Moronne ◽  
...  

2003 ◽  
Vol 104 ◽  
pp. 3-8 ◽  
Author(s):  
H. Ade ◽  
A. L.D. Kilcoyne ◽  
T. Tyliszczak ◽  
P. Hitchcock ◽  
E. Anderson ◽  
...  

2004 ◽  
Vol 10 (S02) ◽  
pp. 1018-1019 ◽  
Author(s):  
Tolek Tyliszczak ◽  
A. L. David Kilcoyne ◽  
J. Alexander Liddle ◽  
Tony Warwick ◽  
Adam P. Hitchcock ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


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