scholarly journals Scintillator Detectors for Scanning Transmission X-ray Microscopes at the Advanced Light Source

Author(s):  
S. Fakra
2002 ◽  
Vol 73 (3) ◽  
pp. 1591-1591 ◽  
Author(s):  
T. Tyliszczak ◽  
P. Hitchcock ◽  
A. L. D. Kilcoyne ◽  
H. Ade ◽  
A. P. Hitchcock ◽  
...  

2002 ◽  
Vol 9 (4) ◽  
pp. 254-257 ◽  
Author(s):  
Tony Warwick ◽  
Harald Ade ◽  
David Kilcoyne ◽  
Michael Kritscher ◽  
Tolek Tylisczcak ◽  
...  

2003 ◽  
Vol 10 (2) ◽  
pp. 125-136 ◽  
Author(s):  
A. L. D. Kilcoyne ◽  
T. Tyliszczak ◽  
W. F. Steele ◽  
S. Fakra ◽  
P. Hitchcock ◽  
...  

1998 ◽  
Vol 69 (8) ◽  
pp. 2964-2973 ◽  
Author(s):  
T. Warwick ◽  
K. Franck ◽  
J. B. Kortright ◽  
G. Meigs ◽  
M. Moronne ◽  
...  

2003 ◽  
Vol 104 ◽  
pp. 3-8 ◽  
Author(s):  
H. Ade ◽  
A. L.D. Kilcoyne ◽  
T. Tyliszczak ◽  
P. Hitchcock ◽  
E. Anderson ◽  
...  

2004 ◽  
Vol 10 (S02) ◽  
pp. 1018-1019 ◽  
Author(s):  
Tolek Tyliszczak ◽  
A. L. David Kilcoyne ◽  
J. Alexander Liddle ◽  
Tony Warwick ◽  
Adam P. Hitchcock ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


Author(s):  
Hendrik Ohldag ◽  
Thomas Feggeler ◽  
David A. Shapiro ◽  
Yatish Kumar ◽  
Gregory Portman ◽  
...  

1996 ◽  
Vol 441 ◽  
Author(s):  
Hyun-Joon Shin ◽  
Kwangho Jeong ◽  
David C. Johnson ◽  
Stephen D. Kevan ◽  
Myungkeun Noh ◽  
...  

AbstractTiSe2/NbSe2 superlattices crystallized from elementally modulated films have been studied with a Scanning Transmission X-ray Microscope (STXM) at the Advanced Light Source. The samples exhibited structures in the plane of the film with sizes of the order of one micrometer. The chemical sensitivity of STXM allowed us to infer that the titanium in the superlattice exists predominantly in microcrystalline TiSe2, but that these microcrystals are interspersed with elemental titanium inclusions. The STXM images reflect the interfacial nucleation between the constituent layers characteristic of the kinetic trapping method.


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