High aspect ratio submicron silicon pillars fabricated by photoassisted electrochemical etching and oxidation

1995 ◽  
Vol 67 (13) ◽  
pp. 1877-1879 ◽  
Author(s):  
H. W. Lau ◽  
G. J. Parker ◽  
R. Greef ◽  
M. Hölling
2014 ◽  
Vol 105 (12) ◽  
pp. 123111 ◽  
Author(s):  
Torsten Schmidt ◽  
Miao Zhang ◽  
Shun Yu ◽  
Jan Linnros

2018 ◽  
Vol 8 (5) ◽  
pp. 1171-1177 ◽  
Author(s):  
Badriyah Alhalaili ◽  
Daniel M. Dryden ◽  
Ruxandra Vidu ◽  
Soroush Ghandiparsi ◽  
Hilal Cansizoglu ◽  
...  

1993 ◽  
Vol 63 (8) ◽  
pp. 1116-1118 ◽  
Author(s):  
Wei Chen ◽  
Haroon Ahmed

2013 ◽  
Vol 1553 ◽  
Author(s):  
M. K. Dawood ◽  
Z.H. Mai ◽  
T. H. Ng ◽  
H. Tan ◽  
P.K. Tan ◽  
...  

ABSTRACTSharper nanotips are required for application in nanoprobing systems due to a shrinking contact size with each new transistor technology node. We describe a two-step etching process to fabricate W nanotips with controllable tip dimensions. The first process is an optimized AC electrochemical etching in KOH to fabricate nanotips with a radius of curvature (ROC) down to 90 nm. This was followed by a secondary nanotip sharpening process by laser irradiation in KOH. High aspect ratio nanotips with ROC close to 20 nm were obtained. Finally we demonstrate the application of the fabricated nanotips for nanoprobing on advanced technology SRAM devices.


2018 ◽  
Vol 11 (9) ◽  
pp. 091001 ◽  
Author(s):  
Fumimasa Horikiri ◽  
Hiroshi Ohta ◽  
Naomi Asai ◽  
Yoshinobu Narita ◽  
Takehiro Yoshida ◽  
...  

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