High temperature (77 °C) operation of 634 nm InGaAlP multiquantum‐well laser diodes with tensile‐strained quantum wells

1993 ◽  
Vol 63 (11) ◽  
pp. 1486-1488 ◽  
Author(s):  
Minoru Watanabe ◽  
John Rennie ◽  
Masaki Okajima ◽  
Gen‐ichi Hatakoshi
1991 ◽  
Vol 240 ◽  
Author(s):  
Toshiaki Tanaka ◽  
Hironori Yanagisawa ◽  
Shin-Ichiro Yano ◽  
Shigekazu Minagawa

ABSTRACTZinc doping is performed on the GalnP/AIGalnP multiquantum well (MQW) structure with the aim of dissolving the ordered atomic arrangement which results in higher quantum levels and therefore shorter lasing wavelengths. It is shown that the photoluminescence (PL) peak wavelength gradually shortens with doping and decreases by 20 nm when the hole concentration reaches 1×1018 cm−3, while the PL relative intensity becomes half that of an undoped MQW layer. Therefore, a moderate level of zinc doping of around 4∼5×1017 cm−3 is desirable to shorten the PL wavelength without decreasing the crystal quality. Transmission electron nano-diffraction patterns confirm that the ordered structure in the MQW layers disappears as the hole concentration increases. On the basis of this data, uniformly p-doped and modulation p-doped MQW laser diodes are fabricated and their characteristics are compared with the undoped MQW lasers. CW operation is achieved at wavelengths of 631 to 633 nm, which is 10 nm shorter than the 643 nm in an undoped MQW laser. Comparatively low threshold currents of 73 and 88 mA are attained for uniformly p-doped and modulation p-doped MQW lasers, respectively. However, they are about 20∼30 mA higher than those of the undoped MQW lasers. This results from the large overflow of electrons from the active layer, and the fact that the differential gain becomes smaller in the 630-nm band.


1996 ◽  
Author(s):  
Decai Sun ◽  
David P. Bour ◽  
K. J. Beernink ◽  
David W. Treat ◽  
Ross D. Bringans

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Agata Bojarska-Cieślińska ◽  
Łucja Marona ◽  
Julita Smalc-Koziorowska ◽  
Szymon Grzanka ◽  
Jan Weyher ◽  
...  

AbstractIn this work we investigate the role of threading dislocations in nitride light emitters with different indium composition. We compare the properties of laser diodes grown on the low defect density GaN substrate with their counterparts grown on sapphire substrate in the same epitaxial process. All structures were produced by metalorganic vapour phase epitaxy and emit light in the range 383–477 nm. We observe that intensity of electroluminescence is strong in the whole spectral region for devices grown on GaN, but decreases rapidly for the devices on sapphire and emitting at wavelength shorter than 420 nm. We interpret this behaviour in terms of increasing importance of dislocation related nonradiative recombination for low indium content structures. Our studies show that edge dislocations are the main source of nonradiative recombination. We observe that long wavelength emitting structures are characterized by higher average light intensity in cathodoluminescence and better thermal stability. These findings indicate that diffusion path of carriers in these samples is shorter, limiting the amount of carriers reaching nonradiative recombination centers. According to TEM images only mixed dislocations open into the V-pits, usually above the multi quantum wells thus not influencing directly the emission.


2017 ◽  
Vol 10 (2) ◽  
pp. 021002 ◽  
Author(s):  
Hideaki Murotani ◽  
Katsuto Nakamura ◽  
Tomonori Fukuno ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  

2001 ◽  
Vol 79 (10) ◽  
pp. 1483-1485 ◽  
Author(s):  
S. P. Łepkowski ◽  
H. Teisseyre ◽  
T. Suski ◽  
P. Perlin ◽  
N. Grandjean ◽  
...  

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