Reactive ion etching end‐point determination by plasma impedance monitoring
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2001 ◽
Vol 40
(Part 1, No. 3A)
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pp. 1457-1462
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1979 ◽
Vol 16
(2)
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pp. 385-387
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2003 ◽
Vol 65
(1-2)
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pp. 25-46
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1983 ◽
Vol 1
(2)
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pp. 501
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1994 ◽
Vol 27
(1)
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pp. 39-45
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2000 ◽
Vol 54
(3-4)
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pp. 303-314
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1984 ◽
Vol 131
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pp. 214-215
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