Structural imperfections in silicon dioxide films identified with vacuum ultraviolet optical absorption measurements

1991 ◽  
Vol 59 (5) ◽  
pp. 528-530 ◽  
Author(s):  
Koichi Awazu ◽  
Hiroshi Kawazoe ◽  
Yasutoshi Saito ◽  
Kikuo Watanabe ◽  
Toshio Ando
Keyword(s):  
Optical Absorption ◽  
Silicon Dioxide ◽  
Vacuum Ultraviolet ◽  
Silicon Dioxide Films ◽  
Structural Imperfections ◽  
Absorption Measurements

Measurements and Modelling of Thin Silicon Dioxide Films on Silicon

1989 ◽  
Author(s):  
A. Kalnitsky ◽  
S. P. Tay ◽  
J. P. Ellul ◽  
J. W. Andrews ◽  
E. A. Irene ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Silicon Dioxide Films ◽  
Thin Silicon

Selection and characteristics of peptides that bind thermally grown silicon dioxide films

2005 ◽  
Vol 22 (5-6) ◽  
pp. 201-204 ◽  
Author(s):  
Edward Eteshola ◽  
Leonard J. Brillson ◽  
Stephen Craig Lee
Keyword(s):  
Silicon Dioxide ◽  
Silicon Dioxide Films ◽  
Thermally Grown

Characterization of Tunneling Current through Ultrathin Silicon Dioxide Films by Different-Metal Gates Method

2008 ◽  
Vol 47 (11) ◽  
pp. 8317-8320
Author(s):  
Takaaki Hirokane ◽  
Naoto Yoshii ◽  
Tatsuya Okazaki ◽  
Shinichi Urabe ◽  
Kazuo Nishimura ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Tunneling Current ◽  
Metal Gates ◽  
Silicon Dioxide Films

scholarly journals Modeling the breakdown spots in silicon dioxide films as point contacts

1999 ◽  
Vol 75 (7) ◽  
pp. 959-961 ◽  
Author(s):  
J. Suñé ◽  
E. Miranda ◽  
M. Nafría ◽  
X. Aymerich
Keyword(s):  
Silicon Dioxide ◽  
Point Contacts ◽  
Silicon Dioxide Films

Comment on ‘‘Optical absorption measurements of hydrogen at megabar pressures’’

1995 ◽  
Vol 52 (2) ◽  
pp. 1405-1407 ◽  
Author(s):  
Arthur L. Ruoff ◽  
Kouros Ghandehari
Keyword(s):  
Optical Absorption ◽  
Absorption Measurements
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