Body current scanning: A novel technique for characterizing the floating body effects and parasitic bipolar action in silicon‐on‐insulator metal‐oxide‐semiconductor transistors
2003 ◽
Vol 20
(5)
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pp. 767-769
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Keyword(s):
2000 ◽
Vol 39
(Part 1, No. 6A)
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pp. 3271-3276
2018 ◽
Vol 57
(6S1)
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pp. 06HD03
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1997 ◽
Vol 15
(6)
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pp. 2836
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2007 ◽
Vol 46
(12)
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pp. 7635-7638
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