Ballistic‐electron‐emission microscopy investigation of Schottky barrier interface formation

M. H. Hecht; L. D. Bell; W. J. Kaiser; F. J. Grunthaner

doi:10.1063/1.101778

Ballistic‐electron‐emission microscopy investigation of Schottky barrier interface formation

Applied Physics Letters ◽

10.1063/1.101778 ◽

1989 ◽

Vol 55 (8) ◽

pp. 780-782 ◽

Cited By ~ 53

Author(s):

M. H. Hecht ◽

L. D. Bell ◽

W. J. Kaiser ◽

F. J. Grunthaner

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Interface Formation ◽

Ballistic Electron ◽

Microscopy Investigation ◽

Emission Microscopy

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Ballistic electron emission microscopy investigation of SiGe nanostructures fabricated using reactive-ion etching

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585939 ◽

1992 ◽

Vol 10 (6) ◽

pp. 3112 ◽

Cited By ~ 8

Author(s):

J. G. Couillard

Keyword(s):

Electron Emission ◽

Reactive Ion Etching ◽

Ballistic Electron Emission Microscopy ◽

Ion Etching ◽

Ballistic Electron ◽

Microscopy Investigation ◽

Emission Microscopy

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Cross Sectional Ballistic Electron Emission Microscopy for Schottky Barrier Height Profiling on Heterostructures

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.2204 ◽

2006 ◽

Vol 45 (3B) ◽

pp. 2204-2207

Author(s):

Doris Rakoczy ◽

Gottfried Strasser ◽

Jürgen Smoliner

Keyword(s):

Schottky Barrier ◽

Barrier Height ◽

Electron Emission ◽

Schottky Barrier Height ◽

Ballistic Electron Emission Microscopy ◽

Cross Sectional ◽

Ballistic Electron ◽

Emission Microscopy

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Erratum: ‘‘Ballistic electron emission microscopy investigation of SiGe nanostructures fabricated using reactive-ion etching’’ [J. Vac. Sci. Technol. B 10, 3112 (1992)]

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.586785 ◽

1993 ◽

Vol 11 (3) ◽

pp. 766 ◽

Cited By ~ 1

Author(s):

J. G. Couillard

Keyword(s):

Electron Emission ◽

Reactive Ion Etching ◽

Ballistic Electron Emission Microscopy ◽

Ion Etching ◽

Ballistic Electron ◽

Microscopy Investigation ◽

Emission Microscopy

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Time dependent changes in Schottky barrier mapping of the W/Si(001) interface utilizing ballistic electron emission microscopy

Journal of Applied Physics ◽

10.1063/1.4922972 ◽

2015 ◽

Vol 117 (24) ◽

pp. 245306 ◽

Cited By ~ 9

Author(s):

Chris A. Durcan ◽

Robert Balsano ◽

Vincent P. LaBella

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Time Dependent ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Hot-carrier scattering in a metal: A ballistic-electron-emission microscopy investigation on PtSi

Physical Review B ◽

10.1103/physrevb.48.8833 ◽

1993 ◽

Vol 48 (12) ◽

pp. 8833-8839 ◽

Cited By ~ 34

Author(s):

Philipp Niedermann ◽

Lidia Quattropani ◽

Katalin Solt ◽

Ivan Maggio-Aprile ◽

O/ystein Fischer

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Hot Carrier ◽

Ballistic Electron ◽

Carrier Scattering ◽

Microscopy Investigation ◽

Emission Microscopy

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Modification of GaN Schottky barrier interfaces probed by ballistic-electron-emission microscopy and spectroscopy

Applied Physics Letters ◽

10.1063/1.126148 ◽

2000 ◽

Vol 76 (13) ◽

pp. 1725-1727 ◽

Cited By ~ 10

Author(s):

L. D. Bell ◽

R. P. Smith ◽

B. T. McDermott ◽

E. R. Gertner ◽

R. Pittman ◽

...

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Nanoscale Schottky barrier mapping of thermally evaporated and sputter deposited W/Si(001) diodes using ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4958721 ◽

2016 ◽

Vol 34 (4) ◽

pp. 04J110 ◽

Cited By ~ 4

Author(s):

Westly Nolting ◽

Chris Durcan ◽

Avyaya J. Narasimham ◽

Vincent P. LaBella

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Sputter Deposited

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Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111)

Physical Review B ◽

10.1103/physrevb.52.1816 ◽

1995 ◽

Vol 52 (3) ◽

pp. 1816-1829 ◽

Cited By ~ 22

Author(s):

E. Y. Lee ◽

H. Sirringhaus ◽

U. Kafader ◽

H. von Känel

Keyword(s):

Electron Emission ◽

Carrier Transport ◽

Ballistic Electron Emission Microscopy ◽

Hot Carrier ◽

Ballistic Electron ◽

Microscopy Investigation ◽

Emission Microscopy

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Cross-sectional ballistic electron emission microscopy for Schottky barrier height profiling on heterostructures

Applied Physics Letters ◽

10.1063/1.1924882 ◽

2005 ◽

Vol 86 (20) ◽

pp. 202112 ◽

Cited By ~ 3

Author(s):

D. Rakoczy ◽

G. Strasser ◽

J. Smoliner

Keyword(s):

Schottky Barrier ◽

Barrier Height ◽

Electron Emission ◽

Schottky Barrier Height ◽

Ballistic Electron Emission Microscopy ◽

Cross Sectional ◽

Ballistic Electron ◽

Emission Microscopy

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Direct Measurements of Lateral Variations of Schottky Barrier Height Across “End-On” Metal Contacts to Vertical Si Nanowires by Ballistic Electron Emission Microscopy

Nano Letters ◽

10.1021/nl203568c ◽

2012 ◽

Vol 12 (2) ◽

pp. 694-698 ◽

Cited By ~ 6

Author(s):

Wei Cai ◽

Yulu Che ◽

Jonathan P. Pelz ◽

Eric R. Hemesath ◽

Lincoln J. Lauhon

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Schottky Barrier Height ◽

Metal Contacts ◽

Ballistic Electron Emission Microscopy ◽

Si Nanowires ◽

Ballistic Electron ◽

Direct Measurements ◽

Emission Microscopy ◽

Lateral Variations

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