scholarly journals Experimental Equipment for Studying the Residual Stresses Developed During High Temperature Reactions by X-Ray Diffraction

1996 ◽  
Vol 06 (C4) ◽  
pp. C4-259-C4-266
Author(s):  
F. Bernard ◽  
E. Sciora ◽  
N. Gerard
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
Experimental Equipment ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Temperature Reactions

Niobium-bearing arsenides and germanides from elemental mixtures not involving niobium: a new twist to an old problem in solid-state synthesis

2018 ◽  
Vol 74 (5) ◽  
pp. 623-627 ◽  
Author(s):  
Sviatoslav Baranets ◽  
Hua He ◽  
Svilen Bobev
Keyword(s):  
High Temperature ◽  
Solid State ◽  
Diffraction Data ◽  
Alkaline Earth ◽  
Alkaline Earth Metals ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Temperature Reactions ◽  
First Time ◽  
Synthetic Work

Three isostructural transition-metal arsenides and germanides, namely niobium nickel arsenide, Nb0.92(1)NiAs, niobium cobalt arsenide, NbCoAs, and niobium nickel germanide, NbNiGe, were obtained as inadvertent side products of high-temperature reactions in sealed niobium containers. In addition to reporting for the very first time the structures of the title compounds, refined from single-crystal X-ray diffraction data, this article also serves as a reminder that niobium containers may not be suitable for the synthesis of ternary arsenides and germanides by traditional high-temperature reactions. Synthetic work involving alkali or alkaline-earth metals, transition or early post-transition metals, and elements from groups 14 or 15 under such conditions may yield Nb-containing products, which at times could be the major products of such reactions.

scholarly journals Investigation on origins of residual stresses in Ni-NiO system by X-ray diffraction at high temperature

1993 ◽  
Vol 03 (C9) ◽  
pp. C9-987-C9-997 ◽  
Author(s):  
Chun Liu ◽  
Anne-Marie Huntz ◽  
Jean-Lou Lebrun
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
X Ray Diffraction ◽  
X Ray

D-28 Local Residual Stresses and Thermal Fatigue in CrN Coatings on Steel Characterized by High-Temperature Synchrotron X-ray Diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 173-173
Author(s):  
K. J. Martinschitz ◽  
Ch. Kirchlechner ◽  
R. Daniel ◽  
Ch. Mitterer ◽  
J. Keckes
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
Thermal Fatigue ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crn Coatings

High Pressure-High Temperature Reactions in Xenon-Chlorine System

2006 ◽  
Vol 987 ◽  
Author(s):  
Maddury Somayazulu ◽  
Steven Gramsch ◽  
Ho-Kwang Mao ◽  
Russell Hemley
Keyword(s):  
Solid Solution ◽  
High Pressure ◽  
High Temperature ◽  
Visible Range ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Pressure High Temperature ◽  
High Temperature Reactions ◽  
Pressure Interval ◽  
Absorption Measurements

AbstractWe present results of studies of the xenon-chlorine system to 60 GPa and temperature range 300 to 2000 K. Using a combination of Raman spectroscopy, infrared spectroscopy and synchrotron x-ray diffraction; we characterize the products of diamond cell experiments. In the 2-20 GPa pressure interval, we observe the formation of a deep red crystalline phase. Above 15 GPa, and at high temperature, a solid solution of Xe and Cl2 appears to form. Comparison of the ultraviolet-visible and infrared absorption measurements on the proposed alloy of Xe and Cl2 show that band edge moves into the visible range at high pressure

Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction

2010 ◽  
Vol 518 (8) ◽  
pp. 2090-2096 ◽  
Author(s):  
C. Kirchlechner ◽  
K.J. Martinschitz ◽  
R. Daniel ◽  
M. Klaus ◽  
C. Genzel ◽  
...  
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
Thermal Fatigue ◽  
Hard Coatings ◽  
X Ray Diffraction ◽  
X Ray

High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method

2007 ◽  
Vol 78 (3) ◽  
pp. 036103 ◽  
Author(s):  
J. Keckes ◽  
E. Eiper ◽  
K. J. Martinschitz ◽  
H. Köstenbauer ◽  
R. Daniel ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Residual Stresses ◽  
X Ray Diffraction ◽  
X Ray ◽  
Substrate Curvature

Measurement of residual stresses by X-ray diffraction in a system obtained by high temperature oxidation

1988 ◽  
Vol 36 (10) ◽  
pp. 2779-2786 ◽  
Author(s):  
A. Aubry ◽  
F. Armanet ◽  
G. Beranger ◽  
J.L. Lebrun ◽  
G. Maeder
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
High Temperature Oxidation ◽  
X Ray Diffraction ◽  
Temperature Oxidation ◽  
X Ray

Synthese und Kristallstruktur von NiHo2(B2O5)2, das erste Nickellanthanoidborat mit einem 2∞(B2O5)4- -Anion / Synthesis and Crystal Structure of NiHo2(B2O5)2, the First Nickel Lanthanoid Borates with a (B2O5)4- Anion

1996 ◽  
Vol 51 (5) ◽  
pp. 677-680 ◽  
Author(s):  
Karsten Bluhm ◽  
André Wiesch
Keyword(s):  
Crystal Structure ◽  
High Temperature ◽  
Single Crystals ◽  
Oxygen Octahedra ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Synthesis And Crystal Structure ◽  
Space Group ◽  
X Ray ◽  
High Temperature Reactions

Single crystals of NiHo2(B2O5)2 were prepared by a B2O3 flux-technique in high temperature reactions at 1450 °C and investigated by X-ray diffraction. They crystallize in the space group C2h5-P21/c (Nr. 14) with a = 451.0(4); b = 724.8(3); c = 938.8(6) pm; β = 91,39( 1)°; Z = 2. The compound is isotypic to CuTb2 (B2O5)2 as well as to the gadolinite structure (FeY2(BeSiO5)2) and contains a two dimensional infinite anion with the formula 2∞ (B2O5)4-. The borate layers consist of four- and eight-membered rings of edge-sharing BO4 tetrahedra. The layers are connected via copper-centered elongated oxygen-octahedra and slightly distorted tetragonal HoO8 antiprisms.

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