scholarly journals Investigation on origins of residual stresses in Ni-NiO system by X-ray diffraction at high temperature

1993 ◽  
Vol 03 (C9) ◽  
pp. C9-987-C9-997 ◽  
Author(s):  
Chun Liu ◽  
Anne-Marie Huntz ◽  
Jean-Lou Lebrun
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
X Ray Diffraction ◽  
X Ray

D-28 Local Residual Stresses and Thermal Fatigue in CrN Coatings on Steel Characterized by High-Temperature Synchrotron X-ray Diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 173-173
Author(s):  
K. J. Martinschitz ◽  
Ch. Kirchlechner ◽  
R. Daniel ◽  
Ch. Mitterer ◽  
J. Keckes
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
Thermal Fatigue ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crn Coatings

Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction

2010 ◽  
Vol 518 (8) ◽  
pp. 2090-2096 ◽  
Author(s):  
C. Kirchlechner ◽  
K.J. Martinschitz ◽  
R. Daniel ◽  
M. Klaus ◽  
C. Genzel ◽  
...  
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
Thermal Fatigue ◽  
Hard Coatings ◽  
X Ray Diffraction ◽  
X Ray

High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method

2007 ◽  
Vol 78 (3) ◽  
pp. 036103 ◽  
Author(s):  
J. Keckes ◽  
E. Eiper ◽  
K. J. Martinschitz ◽  
H. Köstenbauer ◽  
R. Daniel ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Residual Stresses ◽  
X Ray Diffraction ◽  
X Ray ◽  
Substrate Curvature

Measurement of residual stresses by X-ray diffraction in a system obtained by high temperature oxidation

1988 ◽  
Vol 36 (10) ◽  
pp. 2779-2786 ◽  
Author(s):  
A. Aubry ◽  
F. Armanet ◽  
G. Beranger ◽  
J.L. Lebrun ◽  
G. Maeder
Keyword(s):  
High Temperature ◽  
Residual Stresses ◽  
High Temperature Oxidation ◽  
X Ray Diffraction ◽  
Temperature Oxidation ◽  
X Ray

High temperature X-ray diffraction investigation of an aluminium-silicon-corundum system

2007 ◽  
Vol 2007 (suppl_26) ◽  
pp. 369-374 ◽  
Author(s):  
D. Garipoli ◽  
P. Bergese ◽  
E. Bontempi ◽  
M. Minicucci ◽  
A. Di Cicco ◽  
...  
Keyword(s):  
High Temperature ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals X-ray Determination of Compressive Residual Stresses in Spring Steel Generated by High-Speed Water Quenching

Materials ◽  
2019 ◽  
Vol 12 (7) ◽  
pp. 1154
Author(s):  
Diego E. Lozano ◽  
George E. Totten ◽  
Yaneth Bedolla-Gil ◽  
Martha Guerrero-Mata ◽  
Marcel Carpio ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Residual Stresses ◽  
High Speed ◽  
Spring Steel ◽  
X Ray Diffraction ◽  
Laboratory Equipment ◽  
X Ray ◽  
Water Chamber ◽  
Hardened Case ◽  
Compressive Residual Stresses

Automotive components manufacturers use the 5160 steel in leaf and coil springs. The industrial heat treatment process consists in austenitizing followed by the oil quenching and tempering process. Typically, compressive residual stresses are induced by shot peening on the surface of automotive springs to bestow compressive residual stresses that improve the fatigue resistance and increase the service life of the parts after heat treatment. In this work, a high-speed quenching was used to achieve compressive residual stresses on the surface of AISI/SAE 5160 steel samples by producing high thermal gradients and interrupting the cooling in order to generate a case-core microstructure. A special laboratory equipment was designed and built, which uses water as the quenching media in a high-speed water chamber. The severity of the cooling was characterized with embedded thermocouples to obtain the cooling curves at different depths from the surface. Samples were cooled for various times to produce different hardened case depths. The microstructure of specimens was observed with a scanning electron microscope (SEM). X-ray diffraction (XRD) was used to estimate the magnitude of residual stresses on the surface of the specimens. Compressive residual stresses at the surface and sub-surface of about −700 MPa were obtained.

scholarly journals High-pressure synthesis and crystal structure of the mixed-cation borate Ga4In4B15O33(OH)3

2019 ◽  
Vol 74 (4) ◽  
pp. 357-363
Author(s):  
Daniela Vitzthum ◽  
Hubert Huppertz
Keyword(s):  
Crystal Structure ◽  
High Pressure ◽  
High Temperature ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Synthesis And Crystal Structure ◽  
X Ray ◽  
Mixed Cation ◽  
High Pressure High Temperature ◽  
Pressure Synthesis

AbstractThe mixed cation triel borate Ga4In4B15O33(OH)3 was synthesized in a Walker-type multianvil apparatus at high-pressure/high-temperature conditions of 12.5 GPa and 1300°C. Although the product could not be reproduced in further experiments, its crystal structure could be reliably determined via single-crystal X-ray diffraction data. Ga4In4B15O33(OH)3 crystallizes in the tetragonal space group I41/a (origin choice 2) with the lattice parameters a = 11.382(2), c = 15.244(2) Å, and V = 1974.9(4) Å3. The structure of the quaternary triel borate consists of a complex network of BO4 tetrahedra, edge-sharing InO6 octahedra in dinuclear units, and very dense edge-sharing GaO6 octahedra in tetranuclear units.

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