scholarly journals Device and circuit performance analysis of double gate junctionless transistors at L g = 18 nm

2014 ◽  
Vol 2014 (3) ◽  
pp. 105-110 ◽  
Author(s):  
Chitrakant Sahu ◽  
Jawar Singh
Keyword(s):  
Performance Analysis ◽  
Double Gate ◽  
Circuit Performance ◽  
Junctionless Transistors

Implementation of double-gate junctionless transistor and its circuit performance analysis

2016 ◽  
Author(s):  
Rhushikesh K. Joshi ◽  
T. V. Arjun ◽  
S. Ahish ◽  
Dheeraj Sharma ◽  
M. H. Vasantha ◽  
...  
Keyword(s):  
Performance Analysis ◽  
Double Gate ◽  
Circuit Performance ◽  
Junctionless Transistor

SPICESoft: AUTOMATED TOOL FOR SENSITIVITY ANALYSIS, PERFORMANCE ANALYSIS, AND INVERSE PERFORMANCE ANALYSIS OF DIGITAL CIRCUITS

2008 ◽  
Vol 17 (02) ◽  
pp. 221-238
Author(s):  
K. S. YEO ◽  
Z. H. KONG
Keyword(s):  
Sensitivity Analysis ◽  
Performance Analysis ◽  
Digital Circuits ◽  
Circuit Analysis ◽  
Analysis Tool ◽  
Circuit Performance ◽  
Simulation Results ◽  
Differential Expansion ◽  
The Relationship ◽  
Automated Tool

An automated circuit analysis tool called SPICESoft, the main objective of which is to help designers in sensitivity computation and circuit analysis is presented. Three main features of SPICESoft are described, namely Sensitivity Analysis, Circuit Performance Analysis, and Inverse Circuit Performance Analysis. A new methodology called Binary Differential Expansion used for data interpolation is also described in this paper. The relationship between device and process parameters is covered. The simulation results obtained using the proposed automated tool are compared with those of conventional computation.

Performance Analysis Method under Time-Space Variations

2011 ◽  
Vol 186 ◽  
pp. 494-498
Author(s):  
Hu Jing
Keyword(s):  
Performance Analysis ◽  
Integrated Circuit ◽  
Process Variations ◽  
Temporal Variations ◽  
High Order ◽  
Quadratic Model ◽  
Analysis Model ◽  
Circuit Performance ◽  
Time Space ◽  
And Function

With shrinking process size, many variations have a growing impact on circuit performance for today’s integrated circuit(IC) technologies. In this paper, we describe a high-order model of circuit performance analysis under time-space variations. The time-space variations, such as process variations, place and route imformance, environment parameters and temporal variations, are included in hierarachical perfornance analysis. The time-space variations are increased in variance analysis. Based on quadratic model, coefficients of the K-L expansion and function item are decided. The high-order analysis model is built. The result of experiment proves that the proposed method can improve analysis performance effectively.

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