The Fifth International Conference on VLSI Design
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An Efficient Rule Based Fault Simulator

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658038 ◽

2005 ◽

Author(s):

O. Tharakan ◽

J. Jacob ◽

M.K. Srinivas

Keyword(s):

Rule Based

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A New algorithm for combined PLA folding

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658090 ◽

2005 ◽

Author(s):

C.R. Mohan ◽

P.P. Chakrabarti ◽

S. Ghose

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Scalable, Pipelined, Cmos VLSI Content Addressable Memory Chips - Architecture And Implementation

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658040 ◽

2005 ◽

Cited By ~ 2

Author(s):

K. Ghose ◽

A. Gupta

Keyword(s):

Content Addressable Memory ◽

Cmos Vlsi

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CPM Pole-Zero Computation Using The Generalized Eigenproblem Approach

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658062 ◽

2005 ◽

Author(s):

R.S. Rana ◽

A.B. Bhattacharyya

Keyword(s):

Generalized Eigenproblem

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An Array Architecture for Computing KLT Basis Vectors

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658041 ◽

2005 ◽

Author(s):

A.S. Dhar

Keyword(s):

Array Architecture ◽

Basis Vectors

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Benchmarking Array Comparators

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658087 ◽

2005 ◽

Author(s):

S. Mourad

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A Two-dimensional Systolic Array Processor for Image Processing

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658050 ◽

2005 ◽

Cited By ~ 5

Author(s):

N. Ranganathan ◽

M. Patell ◽

P.A. McCabe

Keyword(s):

Image Processing ◽

Systolic Array ◽

Two Dimensional ◽

Array Processor

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Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658079 ◽

2005 ◽

Cited By ~ 1

Author(s):

A. Dharchoudhury ◽

S.M. Kang

Keyword(s):

Performance Analysis ◽

Worst Case ◽

Circuit Performance ◽

Model Parameter ◽

Device Model ◽

Parameter Values

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A Simple Model for Lindhard Continuum Potential useful for Channeling Simulation

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658078 ◽

2005 ◽

Author(s):

R. Ghosh ◽

S. Dasgupta

Keyword(s):

Simple Model

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On Computing Tests for Bridging and Leakage Faults: Complexity Results and Universal Test Sets

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658020 ◽

2005 ◽

Cited By ~ 8

Author(s):

S. Chakravarty

Keyword(s):

Universal Test ◽

Complexity Results ◽

Test Sets

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The Fifth International Conference on VLSI DesignLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

An Efficient Rule Based Fault Simulator

A New algorithm for combined PLA folding

Scalable, Pipelined, Cmos VLSI Content Addressable Memory Chips - Architecture And Implementation

CPM Pole-Zero Computation Using The Generalized Eigenproblem Approach

An Array Architecture for Computing KLT Basis Vectors

Benchmarking Array Comparators

A Two-dimensional Systolic Array Processor for Image Processing

Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis

A Simple Model for Lindhard Continuum Potential useful for Channeling Simulation

On Computing Tests for Bridging and Leakage Faults: Complexity Results and Universal Test Sets

The Fifth International Conference on VLSI Design
Latest Publications