Energy-efficient self-timed circuit design using supply voltage scaling

W. Kuang; J.S. Yuan

doi:10.1049/ip-cds:20040296

Energy-efficient self-timed circuit design using supply voltage scaling

IEE Proceedings - Circuits Devices and Systems ◽

10.1049/ip-cds:20040296 ◽

2004 ◽

Vol 151 (4) ◽

pp. 278

Author(s):

W. Kuang ◽

J.S. Yuan

Keyword(s):

Circuit Design ◽

Energy Efficient ◽

Supply Voltage ◽

Voltage Scaling ◽

Supply Voltage Scaling

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The Complete Switching Circuit Design for CPU Joint Body Biasing and Supply Voltage Scaling

ZANCO Journal of Pure and Applied Sciences ◽

10.21271/zjpas.31.s3.3 ◽

2019 ◽

Vol 31 (s3) ◽

Keyword(s):

Circuit Design ◽

Supply Voltage ◽

Voltage Scaling ◽

Switching Circuit ◽

Body Biasing ◽

Supply Voltage Scaling

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Robust Subthreshold CMOS Digital Circuit Design with On-Chip Adaptive Supply Voltage Scaling Technique

IEICE Transactions on Electronics ◽

10.1587/transele.e94.c.80 ◽

2011 ◽

Vol E94-C (1) ◽

pp. 80-88 ◽

Cited By ~ 1

Author(s):

Yuji OSAKI ◽

Tetsuya HIROSE ◽

Kei MATSUMOTO ◽

Nobutaka KUROKI ◽

Masahiro NUMA

Keyword(s):

Circuit Design ◽

Supply Voltage ◽

Digital Circuit ◽

Voltage Scaling ◽

Scaling Technique ◽

Digital Circuit Design ◽

Subthreshold Cmos ◽

Supply Voltage Scaling ◽

On Chip

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Impact of technology evolution on dual supply voltage scaling and gate resizing in power-driven logic synthesis

9th International Conference on Electronics, Circuits and Systems ◽

10.1109/icecs.2002.1046264 ◽

2003 ◽

Author(s):

T. Mahnke ◽

W. Stechele ◽

M. Embacher ◽

W. Hoeld

Keyword(s):

Supply Voltage ◽

Logic Synthesis ◽

Voltage Scaling ◽

Technology Evolution ◽

Supply Voltage Scaling ◽

Gate Resizing ◽

Impact Of Technology

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SRAM supply voltage scaling: A reliability perspective

2009 10th International Symposium on Quality of Electronic Design ◽

10.1109/isqed.2009.4810392 ◽

2009 ◽

Cited By ~ 15

Author(s):

Animesh Kumar ◽

Jan Rabaey ◽

Kannan Ramchandran

Keyword(s):

Supply Voltage ◽

Voltage Scaling ◽

Supply Voltage Scaling

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Energy minimization in dynamic supply voltage scaling systems using data dependent voltage level selection

2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353) ◽

10.1109/iscas.2000.856381 ◽

2002 ◽

Cited By ~ 3

Author(s):

L.H. Chandrasena ◽

M.J. Liebelt

Keyword(s):

Energy Minimization ◽

Supply Voltage ◽

Voltage Scaling ◽

Voltage Level ◽

Supply Voltage Scaling ◽

Using Data

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The effect of power supply voltage scaling on the total dose radiation response of fully-depleted SOI MOS transistors

IEEE Transactions on Nuclear Science ◽

10.1109/23.489262 ◽

1995 ◽

Vol 42 (6) ◽

pp. 2122-2126 ◽

Cited By ~ 2

Author(s):

S.T. Liu ◽

W.C. Jenkins

Keyword(s):

Total Dose ◽

Power Supply ◽

Supply Voltage ◽

Voltage Scaling ◽

Radiation Response ◽

Mos Transistors ◽

Power Supply Voltage ◽

Fully Depleted ◽

Supply Voltage Scaling ◽

Dose Radiation

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A new BiCMOS/CMOS gate comparison/design methodology and supply voltage scaling model

10.1109/iedm.1989.74315 ◽

2003 ◽

Cited By ~ 12

Author(s):

P. Raje ◽

K. Saraswat ◽

K. Cham

Keyword(s):

Design Methodology ◽

Supply Voltage ◽

Voltage Scaling ◽

Scaling Model ◽

Supply Voltage Scaling

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Limitation of CMOS supply-voltage scaling by MOSFET threshold-voltage variation

Proceedings of IEEE Custom Integrated Circuits Conference - CICC '94 ◽

10.1109/cicc.1994.379722 ◽

2002 ◽

Author(s):

Shih Wei Sun ◽

P.G.Y. Tsui

Keyword(s):

Threshold Voltage ◽

Supply Voltage ◽

Voltage Scaling ◽

Voltage Variation ◽

Supply Voltage Scaling

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Detectability analysis for resistive open faults with dynamic supply voltage scaling awareness

2011 3rd Asia Symposium on Quality Electronic Design (ASQED) ◽

10.1109/asqed.2011.6111742 ◽

2011 ◽

Cited By ~ 3

Author(s):

Mohamed Tag Elsir Mohammadat ◽

Noohul Basheer Zain Ali ◽

Fawnizu Azmadi Hussin

Keyword(s):

Supply Voltage ◽

Voltage Scaling ◽

Supply Voltage Scaling ◽

Open Faults

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Supply-Voltage Scaling Close to the Fundamental Limit Under Process Variations in Nanometer Technologies

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2151257 ◽

2011 ◽

Vol 58 (8) ◽

pp. 2808-2813 ◽

Cited By ~ 10

Author(s):

Myeong-Eun Hwang

Keyword(s):

Supply Voltage ◽

Process Variations ◽

Voltage Scaling ◽

Fundamental Limit ◽

Supply Voltage Scaling

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