Method for determination of carrier capture cross-sections at Si∕SiO2 interface

2004 ◽  
Vol 40 (2) ◽  
pp. 148 ◽  
Author(s):  
L. Wang ◽  
A. Neugroschel
2021 ◽  
Vol 11 (2) ◽  
pp. 273-281
Author(s):  
Manjula Siriwardhana ◽  
Yan Zhu ◽  
Ziv Hameiri ◽  
Daniel Macdonald ◽  
Fiacre Rougieux

2006 ◽  
Vol 100 (9) ◽  
pp. 093716 ◽  
Author(s):  
C. Z. Zhao ◽  
J. F. Zhang ◽  
M. B. Zahid ◽  
B. Govoreanu ◽  
G. Groeseneken ◽  
...  

1986 ◽  
Vol 70 ◽  
Author(s):  
Jože Furlan ◽  
Slavko Amon

ABSTRACTA general expression for generation-recombination rate in a-Si based on classical SRH theory including different electron and hole capture cross-sections for donor-like and acceptor-like centers inside the mobility gap is derived. Applying appropriate approximations and two-exponential model for localized states distribution two methods of analytical solution are presented and discussed.


2011 ◽  
Vol 59 (2(3)) ◽  
pp. 1713-1716 ◽  
Author(s):  
H. Utsunomiya ◽  
S. Goriely ◽  
H. Akimune ◽  
H. Harada ◽  
F. Kitatani ◽  
...  

1997 ◽  
Vol 482 ◽  
Author(s):  
S. J. Rhee ◽  
S. Kim ◽  
X. Li ◽  
J. J. Coleman ◽  
S. G. Bishop

AbstractTwo-source optical quenching spectroscopy demonstrates that the four site-selective Er3+ photoluminescence (PL) spectra observed in Er-implanted GaN contribute to the above-gap excited Er3+ PL spectrum, with relative efficiencies determined by the carrier capture cross sections and concentrations of the defects or traps which mediate the excitation of each Er site. The above-gap pumped PL spectrum is dominated by two of the trap-mediated Er3+ PL spectra, while the highest concentration Er site, which is efficiently pumped only by direct 4f absorption, contributes only weakly. These experiments indicate that the same defects and impurities are involved in the trapmediated processes responsible for both the above- and the below-gap excitations of the Er3+ PL.


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