CMOS design technique to eliminate the stuck-open fault problem of testability
2006 ◽
Vol E89-A
(4)
◽
pp. 1076-1087
◽
Keyword(s):
2000 ◽
Vol 47
(6)
◽
pp. 2603-2608
◽
2014 ◽
Vol 134
(5)
◽
pp. 283-283
2019 ◽
Vol 7
(5)
◽
pp. 1181-1185
1997 ◽
Keyword(s):