Size-dependent fracture behavior of GaN pillars under room temperature compression
Keyword(s):
Single crystalline GaN pillars are characterized by in situ compression tests inside electron microscopes, showing distinct size-dependent fracture behavior at room temperature for potential microelectronics, power device and MEMS applications.
2019 ◽
Vol 21
(7)
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pp. 1801329
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2015 ◽
Vol 65
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pp. 226-249
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2009 ◽
Vol 24
(9)
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pp. 2909-2916
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1992 ◽
Vol 33
(9)
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pp. 802-810
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2005 ◽
Vol 297-300
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pp. 507-514
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1991 ◽
Vol 55
(10)
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pp. 1045-1053