Metal–2D multilayered semiconductor junctions: layer-number dependent Fermi-level pinning
2020 ◽
Vol 8
(9)
◽
pp. 3113-3119
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Keyword(s):
Thickness-dependent performance of metal–two-dimensional semiconductor junctions in electronics/optoelectronics have attracted increasing attention but, currently, little knowledge about the micro-mechanism of this thickness dependence is available.
Keyword(s):
1989 ◽
Vol 36
(10)
◽
pp. 2307-2314
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2018 ◽
Vol 20
(33)
◽
pp. 21732-21738
◽
Keyword(s):
2017 ◽
Vol 9
(22)
◽
pp. 19278-19286
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