Amplitude Response of Single-Wall Carbon Nanotube Probes during Tapping Mode Atomic Force Microscopy:  Modeling and Experiment

A. Kutana; K. P. Giapis; J. Y. Chen; C. P. Collier

doi:10.1021/nl060831o

Amplitude Response of Single-Wall Carbon Nanotube Probes during Tapping Mode Atomic Force Microscopy: Modeling and Experiment

Nano Letters ◽

10.1021/nl060831o ◽

2006 ◽

Vol 6 (8) ◽

pp. 1669-1673 ◽

Cited By ~ 21

Author(s):

A. Kutana ◽

K. P. Giapis ◽

J. Y. Chen ◽

C. P. Collier

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Amplitude Response ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Amplitude Response of Multiwalled Carbon Nanotube Probe with Controlled Length during Tapping Mode Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp804481g ◽

2008 ◽

Vol 112 (40) ◽

pp. 15631-15636 ◽

Cited By ~ 11

Author(s):

A. N. Jiang ◽

S. Gao ◽

X. L. Wei ◽

X. L. Liang ◽

Q. Chen

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Multiwalled Carbon Nanotube ◽

Amplitude Response ◽

Multiwalled Carbon ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Sensitivity Analysis of Carbon Nanotube Characteristics on Dynamic Behavior of Tapping-Mode Atomic Force Microscopy

Nanoscience and Nanotechnology ◽

10.5923/j.nn.20120203.03 ◽

2012 ◽

Vol 2 (3) ◽

pp. 57-65 ◽

Cited By ~ 1

Author(s):

M. H. Korayem ◽

N. Ebrahimi ◽

S. Moloodi

Keyword(s):

Sensitivity Analysis ◽

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Dynamic Behavior ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Influence of the Carbon Nanotube Probe Tilt Angle on the Effective Probe Stiffness and Image Quality in Tapping-Mode Atomic Force Microscopy

The Journal of Physical Chemistry B ◽

10.1021/jp052758g ◽

2005 ◽

Vol 109 (35) ◽

pp. 16658-16664 ◽

Cited By ~ 18

Author(s):

Santiago D. Solares ◽

Yuki Matsuda ◽

William A. Goddard

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Image Quality ◽

Tilt Angle ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Amplitude response of conical multiwalled carbon nanotube probes for atomic force microscopy

RSC Advances ◽

10.1039/c8ra08683d ◽

2019 ◽

Vol 9 (1) ◽

pp. 429-434 ◽

Cited By ~ 2

Author(s):

Xiao Hu ◽

Hang Wei ◽

Ya Deng ◽

Xiannian Chi ◽

Jia Liu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Atomic Force Microscope ◽

Axial Compression ◽

Multiwalled Carbon Nanotube ◽

Amplitude Response ◽

Multiwalled Carbon ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force

Impressive stability of conical carbon nanotube atomic force microscope probes is shown under axial compression during tapping mode.

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Metal bonding strength in low-temperature processed titanium using atomic force microscopy with single-wall carbon nanotube tip

physica status solidi (RRL) - Rapid Research Letters ◽

10.1002/pssr.201308249 ◽

2013 ◽

Vol 8 (2) ◽

pp. 146-149

Author(s):

E. M. Choi ◽

Y. H. Cui ◽

S. H. Kwon ◽

A. R. Kim ◽

H. S. Choi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Low Temperature ◽

Bonding Strength ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Force Microscopy ◽

Metal Bonding ◽

Atomic Force

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Influence of Elastic Deformation on Single-Wall Carbon Nanotube Atomic Force Microscopy Probe Resolution

The Journal of Physical Chemistry B ◽

10.1021/jp047937x ◽

2004 ◽

Vol 108 (36) ◽

pp. 13613-13618 ◽

Cited By ~ 27

Author(s):

Ian R. Shapiro ◽

Santiago D. Solares ◽

Maria J. Esplandiu ◽

Lawrence A. Wade ◽

William A. Goddard ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Elastic Deformation ◽

Atomic Force Microscopy Probe ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Force Microscopy ◽

Atomic Force

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Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Applied Physics Letters ◽

10.1063/1.125581 ◽

1999 ◽

Vol 75 (26) ◽

pp. 4198-4200 ◽

Cited By ~ 39

Author(s):

G. Bar ◽

L. Delineau ◽

R. Brandsch ◽

M. Bruch ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Indentation Depth ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

Review of Scientific Instruments ◽

10.1063/1.2801009 ◽

2007 ◽

Vol 78 (10) ◽

pp. 103707 ◽

Cited By ~ 48

Author(s):

Ozgur Sahin

Keyword(s):

Atomic Force Microscopy ◽

Time Varying ◽

Force Measurements ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Effect of Viscoelastic Properties of Polymers on the Phase Shift in Tapping Mode Atomic Force Microscopy

Langmuir ◽

10.1021/la980969p ◽

1998 ◽

Vol 14 (26) ◽

pp. 7343-7347 ◽

Cited By ~ 36

Author(s):

Georg Bar ◽

Rainer Brandsch ◽

Myung-Hwan Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Phase Shift ◽

Viscoelastic Properties ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽

10.1021/la9908844 ◽

1999 ◽

Vol 15 (25) ◽

pp. 8569-8573 ◽

Cited By ~ 35

Author(s):

William E. Farneth ◽

R. Scott McLean ◽

John D. Bolt ◽

Eleni Dokou ◽

Mark A. Barteau

Keyword(s):

Atomic Force Microscopy ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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