Characterisation of thin boron-doped diamond films using Raman spectroscopy and chemometrics
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A non-destructive chemometric method to determine thickness and boron concentration of as-deposited, thin, heavily doped diamond films by Raman microscopy.
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2006 ◽
Vol 203
(12)
◽
pp. 3147-3151
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2004 ◽
Vol 13
(2)
◽
pp. 282-286
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Keyword(s):
1995 ◽
Vol 10
(6)
◽
pp. 1448-1454
◽
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