scholarly journals Initial stages of CO2 adsorption on CaO: a combined experimental and computational study

2017 ◽  
Vol 19 (6) ◽  
pp. 4231-4242 ◽  
Author(s):  
Brian H. Solis ◽  
Yi Cui ◽  
Xuefei Weng ◽  
Jan Seifert ◽  
Swetlana Schauermann ◽  
...  
Keyword(s):  
Thin Films ◽  
Carbon Dioxide ◽  
Quantum Chemical Calculations ◽  
Absorption Spectroscopy ◽  
Quantum Chemical ◽  
Room Temperature ◽  
Co2 Adsorption ◽  
Computational Study ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection

Room temperature adsorption of carbon dioxide (CO2) on monocrystalline CaO(001) thin films grown on a Mo(001) substrate was studied by infrared reflection–absorption spectroscopy (IRAS) and quantum chemical calculations.

Specific crystal structure of poly(3-hydroxybutyrate) thin films studied by infrared reflection–absorption spectroscopy

2009 ◽  
Vol 51 (1) ◽  
pp. 132-135 ◽  
Author(s):  
Harumi Sato ◽  
Rumi Murakami ◽  
Katsuhito Mori ◽  
Yuriko Ando ◽  
Isao Takahashi ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Absorption Spectroscopy ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection

New Analytical Method of SiO2 Structure by Infrared Reflection Absorption Spectroscopy (Ir-Ras)

1993 ◽  
Vol 318 ◽  
Author(s):  
K. Ishikawa ◽  
H. Ogawa ◽  
C. Inomata ◽  
S. Fujimura ◽  
H. Mori
Keyword(s):  
Thin Films ◽  
Dielectric Function ◽  
Absorption Spectroscopy ◽  
Analytical Method ◽  
Oxide Films ◽  
Interface Structure ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection ◽  
Phonon Peak ◽  
Viable Method

ABSTRACTSimulation of a thin oxide RAS spectrum obtained by using the dielectric function extracted from thick oxide RAS spectra is shown to be a viable method for the comparison of oxide films of differing thickness. Bulk and near-interfacial features of thermally grown SiO2 thin films were studied by this method and it was found that the LO phonon peak at about 1255 cm−1 reflects bulk SiO2 structure and a higher reflectance between 1100 and 1200 cm−1 reflects SiO2/Si interface structure.

Carbon dioxide adsorption on a ZnO(101̄0) substrate studied by infrared reflection absorption spectroscopy

2014 ◽  
Vol 16 (4) ◽  
pp. 1672-1678 ◽  
Author(s):  
Maria Buchholz ◽  
Peter G. Weidler ◽  
Fabian Bebensee ◽  
Alexei Nefedov ◽  
Christof Wöll
Keyword(s):  
Carbon Dioxide ◽  
Absorption Spectroscopy ◽  
Carbon Dioxide Adsorption ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection
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