Detection of trapped charges in the blend films of polystyrene/SFDBAO electrets by electrostatic and Kelvin probe force microscopy

2016 ◽  
Vol 18 (14) ◽  
pp. 9412-9418 ◽  
Author(s):  
Jin Wang ◽  
Xiao Wang ◽  
Wen-Juan Xu ◽  
Ling-Hai Xie ◽  
Yu-Yu Liu ◽  
...  
Keyword(s):  
Organic Semiconductor ◽  
Charge Trapping ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Blend Films ◽  
Force Microscopy ◽  
Sterically Hindered

The charge trapping properties of the blend of polystyrene (PS) and a sterically hindered organic semiconductor SFDBAO (spiro[fluorene-9,7-dibenzo[c,h]acridin-5-one]) are investigated by electrostatic and Kelvin probe force microscopy (EFM and KPFM).

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

2016 ◽  
Vol 389 ◽  
pp. 783-789 ◽  
Author(s):  
S.V. Kondratenko ◽  
V.S. Lysenko ◽  
Yu. N. Kozyrev ◽  
M. Kratzer ◽  
D.P. Storozhuk ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Local Charge

Charge trapping behavior visualization of dumbbell-shaped DSFXPY via electrical force microscopy

2015 ◽  
Vol 3 (48) ◽  
pp. 12436-12442 ◽  
Author(s):  
Jin Wang ◽  
Xiao Wang ◽  
Wen-Juan Xu ◽  
Zong-Qiong Lin ◽  
Bo Hu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Organic Semiconductor ◽  
Charge Trapping ◽  
Semiconductor Film ◽  
Conductive Atomic Force Microscopy ◽  
Electrical Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sterically Hindered

The electrons and holes are injected into the sterically hindered organic semiconductor film (DSFXPY, 1,6-di(spiro[fluorene-9,90-xanthene]-2-yl)pyrene) through applying controllable biases on the conductive atomic force microscopy tip.

Suppression of the morphology mismatch at graphene/n-type organic semiconductor interfaces: a scanning Kelvin probe force microscopy investigation

2020 ◽  
Vol 8 (24) ◽  
pp. 8145-8154 ◽  
Author(s):  
Federico Chianese ◽  
Fabio Chiarella ◽  
Mario Barra ◽  
Andrea Candini ◽  
Marco Affronte ◽  
...  
Keyword(s):  
Organic Semiconductor ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Graphene Electrode ◽  
Semiconductor Interfaces ◽  
Scanning Kelvin Probe ◽  
Microscopy Investigation ◽  
Contact Effects

Contact effects occurring at organic-semiconductor/graphene-electrode interfaces are directly analyzed in unprecedented detail in n-type OFETs via scanning Kelvin probe force microscopy.

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