Suppression of the morphology mismatch at graphene/n-type organic semiconductor interfaces: a scanning Kelvin probe force microscopy investigation

Federico Chianese; Fabio Chiarella; Mario Barra; Andrea Candini; Marco Affronte; Antonio Cassinese

doi:10.1039/d0tc01099e

Suppression of the morphology mismatch at graphene/n-type organic semiconductor interfaces: a scanning Kelvin probe force microscopy investigation

Journal of Materials Chemistry C ◽

10.1039/d0tc01099e ◽

2020 ◽

Vol 8 (24) ◽

pp. 8145-8154 ◽

Cited By ~ 1

Author(s):

Federico Chianese ◽

Fabio Chiarella ◽

Mario Barra ◽

Andrea Candini ◽

Marco Affronte ◽

...

Keyword(s):

Organic Semiconductor ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Graphene Electrode ◽

Semiconductor Interfaces ◽

Scanning Kelvin Probe ◽

Microscopy Investigation ◽

Contact Effects

Contact effects occurring at organic-semiconductor/graphene-electrode interfaces are directly analyzed in unprecedented detail in n-type OFETs via scanning Kelvin probe force microscopy.

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Phase Separation in Ti-6Al-4V Alloys with Boron Additions for Biomedical Applications: Scanning Kelvin Probe Force Microscopy Investigation of Microgalvanic Couples and Corrosion Initiation

JOM ◽

10.1007/s11837-017-2378-7 ◽

2017 ◽

Vol 69 (8) ◽

pp. 1446-1454 ◽

Cited By ~ 2

Author(s):

P. H. Davis ◽

K. Robles ◽

K. Livingston ◽

S. Johns ◽

V. A. Ravi ◽

...

Keyword(s):

Phase Separation ◽

Biomedical Applications ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Corrosion Initiation ◽

Scanning Kelvin Probe ◽

Microscopy Investigation

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Scanning Kelvin probe force microscopy as a means of predicting the electrochemical characteristics of the surface of a modified AA4xxx/AA3xxx (Al alloys) brazing sheet

Electrochimica Acta ◽

10.1016/j.electacta.2012.10.051 ◽

2013 ◽

Vol 88 ◽

pp. 330-339 ◽

Cited By ~ 26

Author(s):

F. Norouzi Afshar ◽

J.H.W. de Wit ◽

H. Terryn ◽

J.M.C. Mol

Keyword(s):

Al Alloys ◽

Kelvin Probe Force Microscopy ◽

Electrochemical Characteristics ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Hydrogen diffusion and trapping in a low copper 7xxx aluminium alloy investigated by Scanning Kelvin Probe Force Microscopy

Materials Science and Engineering A ◽

10.1016/j.msea.2017.08.119 ◽

2017 ◽

Vol 706 ◽

pp. 126-135 ◽

Cited By ~ 16

Author(s):

Loïc Oger ◽

Manon Chloé Lafouresse ◽

Grégory Odemer ◽

Lionel Peguet ◽

Christine Blanc

Keyword(s):

Aluminium Alloy ◽

Hydrogen Diffusion ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Scanning Kelvin Probe Force Microscopy as a means for comparative quantification of cold-rolling and visualizing the surface susceptibility to galvanic cells; compared to neutron diffraction and EBSD

Progress in Surface Science ◽

10.1016/j.progsurf.2020.100594 ◽

2020 ◽

Vol 95 (3) ◽

pp. 100594

Author(s):

Madjid Sarvghad ◽

Theodore A. Steinberg ◽

Geoffrey Will

Keyword(s):

Neutron Diffraction ◽

Cold Rolling ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Galvanic Cells ◽

Scanning Kelvin Probe

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Hydrogen distribution and segregation in hydrogen-charged S30408 after fracture analyzed via scanning Kelvin probe force microscopy

Applied Surface Science ◽

10.1016/j.apsusc.2020.147050 ◽

2020 ◽

Vol 528 ◽

pp. 147050

Author(s):

Juan Shang ◽

Zhengli Hua

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Hydrogen Distribution ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Applications and Limitations of Scanning Kelvin Probe Force Microscopy for the Surface Analysis of Aluminum Alloys

Journal of The Electrochemical Society ◽

10.1149/1.2349356 ◽

2006 ◽

Vol 153 (11) ◽

pp. B474 ◽

Cited By ~ 51

Author(s):

T. H. Muster ◽

A. E. Hughes

Keyword(s):

Aluminum Alloys ◽

Surface Analysis ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Interfacial hydrogen localization in austenite/martensite dual‐phase steel visualized through optimized silver decoration and scanning Kelvin probe force microscopy

Materials and Corrosion ◽

10.1002/maco.201609104 ◽

2016 ◽

Vol 68 (3) ◽

pp. 306-310 ◽

Cited By ~ 13

Author(s):

T. Nagashima ◽

M. Koyama ◽

A. Bashir ◽

M. Rohwerder ◽

C. C. Tasan ◽

...

Keyword(s):

Dual Phase Steel ◽

Kelvin Probe Force Microscopy ◽

Dual Phase ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Hydrogen distribution at twin boundary in austenitic stainless steel studied by scanning Kelvin probe force microscopy

Materials Letters ◽

10.1016/j.matlet.2018.09.087 ◽

2019 ◽

Vol 234 ◽

pp. 175-178 ◽

Cited By ~ 3

Author(s):

Zhengli Hua ◽

Dongliang Wang ◽

Ziliang Liu ◽

Yiwei Zhang ◽

Shengyi Zhu

Keyword(s):

Stainless Steel ◽

Austenitic Stainless Steel ◽

Twin Boundary ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Hydrogen Distribution ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Improving the Relative Calculations of Volta Potential Differences Acquired from Scanning Kelvin Probe Force Microscopy (SKPFM) By Comparing Inert Standards to First-Principle Calculations

ECS Meeting Abstracts ◽

10.1149/ma2018-01/14/1097 ◽

2018 ◽

Keyword(s):

Kelvin Probe Force Microscopy ◽

First Principle ◽

Kelvin Probe ◽

Force Microscopy ◽

First Principle Calculations ◽

Scanning Kelvin Probe ◽

Volta Potential

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