Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

2016 ◽  
Vol 389 ◽  
pp. 783-789 ◽  
Author(s):  
S.V. Kondratenko ◽  
V.S. Lysenko ◽  
Yu. N. Kozyrev ◽  
M. Kratzer ◽  
D.P. Storozhuk ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Local Charge

Detection of trapped charges in the blend films of polystyrene/SFDBAO electrets by electrostatic and Kelvin probe force microscopy

2016 ◽  
Vol 18 (14) ◽  
pp. 9412-9418 ◽  
Author(s):  
Jin Wang ◽  
Xiao Wang ◽  
Wen-Juan Xu ◽  
Ling-Hai Xie ◽  
Yu-Yu Liu ◽  
...  
Keyword(s):  
Organic Semiconductor ◽  
Charge Trapping ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Blend Films ◽  
Force Microscopy ◽  
Sterically Hindered

The charge trapping properties of the blend of polystyrene (PS) and a sterically hindered organic semiconductor SFDBAO (spiro[fluorene-9,7-dibenzo[c,h]acridin-5-one]) are investigated by electrostatic and Kelvin probe force microscopy (EFM and KPFM).

Local charge writing in epitaxial SmNiO3 thin films

2014 ◽  
Vol 2 (19) ◽  
pp. 3805-3811 ◽  
Author(s):  
Feng Yan ◽  
Frank Schoofs ◽  
Jian Shi ◽  
Sieu D. Ha ◽  
R. Jaramillo ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Force Microscopy ◽  
Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

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