Atom probe tomography of phosphorus doped silicon metalattice
2016 ◽
Vol 11
(1)
◽
pp. 1600376
◽
Keyword(s):
2017 ◽
Vol 23
(S1)
◽
pp. 624-625
◽
2010 ◽
Vol 7
◽
pp. 012004
◽
Atom Probe Tomography Analysis of Boron and/or Phosphorus Distribution in Doped Silicon Nanocrystals
2016 ◽
Vol 120
(31)
◽
pp. 17845-17852
◽
Keyword(s):