Atom probe tomography of size-controlled phosphorus doped silicon nanocrystals
2016 ◽
Vol 11
(1)
◽
pp. 1600376
◽
Keyword(s):
Atom Probe Tomography Analysis of Boron and/or Phosphorus Distribution in Doped Silicon Nanocrystals
2016 ◽
Vol 120
(31)
◽
pp. 17845-17852
◽
Keyword(s):
2017 ◽
Vol 23
(S1)
◽
pp. 624-625
◽
Keyword(s):