Atom Probe Tomography Analysis of Boron and/or Phosphorus Distribution in Doped Silicon Nanocrystals

2016 ◽  
Vol 120 (31) ◽  
pp. 17845-17852 ◽  
Author(s):  
Keita Nomoto ◽  
Hiroshi Sugimoto ◽  
Andrew Breen ◽  
Anna V. Ceguerra ◽  
Takashi Kanno ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Silicon Nanocrystals ◽  
Atom Probe ◽  
Phosphorus Distribution ◽  
Doped Silicon ◽  
Atom Probe Tomography Analysis ◽  
Tomography Analysis

scholarly journals Correlating nanoscale secondary ion mass spectrometry and atom probe tomography analysis of uranium enrichment in metallic nuclear fuel

The Analyst ◽  
2021 ◽  
Vol 146 (1) ◽  
pp. 69-74
Author(s):  
Elizabeth Kautz ◽  
John Cliff ◽  
Timothy Lach ◽  
Dallas Reilly ◽  
Arun Devaraj
Keyword(s):  
Mass Spectrometry ◽  
Nuclear Fuel ◽  
Atom Probe Tomography ◽  
Secondary Ion Mass Spectrometry ◽  
Atom Probe ◽  
Uranium Enrichment ◽  
Length Scales ◽  
Atom Probe Tomography Analysis ◽  
Secondary Ion ◽  
Tomography Analysis

235U enrichment in a metallic nuclear fuel was measured via NanoSIMS and APT, allowing for a direct comparison of enrichment across length scales and resolutions.

scholarly journals Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards

2015 ◽  
Vol 21 (S3) ◽  
pp. 843-844 ◽  
Author(s):  
F. A. Laiginhas ◽  
A. Perez-Huerta ◽  
R. L. Martens ◽  
T. J. Prosa ◽  
D. Reinhard
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atom Probe Tomography Analysis ◽  
Tomography Analysis ◽  
Bulk Chemistry

Atom Probe Tomography Analysis of Grain Boundaries in CdTe

2012 ◽  
Vol 18 (S2) ◽  
pp. 928-929 ◽  
Author(s):  
D.J. Larson ◽  
D.A. Reinhard ◽  
T.J. Prosa ◽  
D. Olson ◽  
D. Lawrence ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atom Probe Tomography Analysis ◽  
Tomography Analysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

scholarly journals Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide — ERRATUM

2016 ◽  
Vol 6 (04) ◽  
pp. 469
Author(s):  
Keita Nomoto ◽  
Sebastian Gutsch ◽  
Anna V. Ceguerra ◽  
Andrew Breen ◽  
Hiroshi Sugimoto ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Silicon Nanocrystals ◽  
Atom Probe ◽  
Boron Doped ◽  
Doped Silicon

scholarly journals Atom Probe Tomography Analysis of TiCx Powders Synthesized by SHS in Al/Fe/Cu–Ti–C Systems

Materials ◽  
2019 ◽  
Vol 12 (24) ◽  
pp. 4095
Author(s):  
Shenbao Jin ◽  
Haokai Su ◽  
Gang Sha
Keyword(s):  
Atom Probe Tomography ◽  
Ion Beam ◽  
Atom Probe ◽  
Particle Properties ◽  
High Temperature Synthesis ◽  
Milling Method ◽  
Atom Probe Tomography Analysis ◽  
Focus Ion Beam ◽  
Tomography Analysis ◽  
Content Of Oxygen

The stoichiometry of titanium carbide (TiCx) particles is important in determining particle properties. Spherical TiCx powders with particle sizes of 1–5 μm were produced by self-propagating high-temperature synthesis (SHS) in 30 wt.% Al–, 30 wt.% Cu–, and 30 wt.% Fe–Ti–C systems, respectively. To measure the compositions of the carbide powders, atom probe tomography (APT) tip specimens were carefully prepared by using a focus ion-beam milling method. APT analysis revealed that the TiCx particles formed in Al–, Cu–, and Fe–Ti–C systems are highly substoichiometric. The results are consistent with observations of the TiCx particles with a high content of oxygen and a certain amount of secondary metallic elements (Al, Cu, and Fe).

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