Influence of Elastic Deformation on Single-Wall Carbon Nanotube Atomic Force Microscopy Probe Resolution

Ian R. Shapiro; Santiago D. Solares; Maria J. Esplandiu; Lawrence A. Wade; William A. Goddard; C. Patrick Collier

doi:10.1021/jp047937x

Influence of Elastic Deformation on Single-Wall Carbon Nanotube Atomic Force Microscopy Probe Resolution

The Journal of Physical Chemistry B ◽

10.1021/jp047937x ◽

2004 ◽

Vol 108 (36) ◽

pp. 13613-13618 ◽

Cited By ~ 27

Author(s):

Ian R. Shapiro ◽

Santiago D. Solares ◽

Maria J. Esplandiu ◽

Lawrence A. Wade ◽

William A. Goddard ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Elastic Deformation ◽

Atomic Force Microscopy Probe ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Force Microscopy ◽

Atomic Force

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Amplitude Response of Single-Wall Carbon Nanotube Probes during Tapping Mode Atomic Force Microscopy: Modeling and Experiment

Nano Letters ◽

10.1021/nl060831o ◽

2006 ◽

Vol 6 (8) ◽

pp. 1669-1673 ◽

Cited By ~ 21

Author(s):

A. Kutana ◽

K. P. Giapis ◽

J. Y. Chen ◽

C. P. Collier

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Amplitude Response ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Metal bonding strength in low-temperature processed titanium using atomic force microscopy with single-wall carbon nanotube tip

physica status solidi (RRL) - Rapid Research Letters ◽

10.1002/pssr.201308249 ◽

2013 ◽

Vol 8 (2) ◽

pp. 146-149

Author(s):

E. M. Choi ◽

Y. H. Cui ◽

S. H. Kwon ◽

A. R. Kim ◽

H. S. Choi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Low Temperature ◽

Bonding Strength ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Force Microscopy ◽

Metal Bonding ◽

Atomic Force

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THEORETICAL ANALYSIS AND EXPERIMENTAL STUDY OF CARBON NANOTUBE PROBE AND CONVENTIONAL ATOMIC FORCE MICROSCOPY PROBE ON SURFACE ROUGHNESS

Chinese Journal of Mechanical Engineering ◽

10.3901/cjme.2008.05.062 ◽

2008 ◽

Vol 21 (05) ◽

pp. 62

Author(s):

Jinghe WANG

Keyword(s):

Experimental Study ◽

Surface Roughness ◽

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Theoretical Analysis ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

Atomic Force

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How does a multiwalled carbon nanotube atomic force microscopy probe affect the determination of surface roughness statistics?

Surface Science ◽

10.1016/s0039-6028(02)01955-6 ◽

2002 ◽

Vol 515 (2-3) ◽

pp. 453-461 ◽

Cited By ~ 16

Author(s):

Q.M. Hudspeth ◽

K.P. Nagle ◽

Y.-P. Zhao ◽

T. Karabacak ◽

C.V. Nguyen ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Multiwalled Carbon Nanotube ◽

Atomic Force Microscopy Probe ◽

Multiwalled Carbon ◽

Force Microscopy ◽

Atomic Force

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Faculty Opinions recommendation of Direct imaging of human SWI/SNF-remodeled mono- and polynucleosomes by atomic force microscopy employing carbon nanotube tips.

Faculty Opinions – Post-Publication Peer Review of the Biomedical Literature ◽

10.3410/f.1003359.36610 ◽

2002 ◽

Author(s):

Peter B Becker

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Direct Imaging ◽

Force Microscopy ◽

Atomic Force

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In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽

10.1021/nl3016347 ◽

2012 ◽

Vol 12 (8) ◽

pp. 4110-4116 ◽

Cited By ~ 13

Author(s):

P. T. Araujo ◽

N. M. Barbosa Neto ◽

H. Chacham ◽

S. S. Carara ◽

J. S. Soares ◽

...

Keyword(s):

Carbon Nanotubes ◽

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Single Wall Carbon Nanotubes ◽

Single Wall Carbon ◽

Force Microscopy ◽

Atomic Force

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Numerical calculation of nonlinear-optical interaction of gold nanoparticle and atomic force microscopy probe

2014 16th International Conference on Transparent Optical Networks (ICTON) ◽

10.1109/icton.2014.6876644 ◽

2014 ◽

Author(s):

Nikolay V. Ilin ◽

Dmitry A. Yashunin ◽

Andrey N. Stepanov ◽

Alexander I. Smirnov

Keyword(s):

Atomic Force Microscopy ◽

Numerical Calculation ◽

Gold Nanoparticle ◽

Nonlinear Optical ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

Atomic Force ◽

Optical Interaction

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Nanoscale localization of the near-surface nitrogen vacancy center assisted by a silicon atomic force microscopy probe

Journal of Physics Photonics ◽

10.1088/2515-7647/abcd86 ◽

2021 ◽

Vol 3 (1) ◽

pp. 014003

Author(s):

Xiangyu Ye ◽

Mengqi Wang ◽

Pengfei Wang ◽

Rui Li ◽

Maosen Guo ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Nitrogen Vacancy ◽

Atomic Force Microscopy Probe ◽

Near Surface ◽

Force Microscopy ◽

Atomic Force ◽

Nitrogen Vacancy Center ◽

Vacancy Center

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Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects

Nanotechnology ◽

10.1088/0957-4484/23/30/305707 ◽

2012 ◽

Vol 23 (30) ◽

pp. 305707 ◽

Cited By ~ 31

Author(s):

A Schulze ◽

T Hantschel ◽

A Dathe ◽

P Eyben ◽

X Ke ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Electrical Tomography ◽

Force Microscopy ◽

Atomic Force

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Insulator-conductor transition in carbon nanotube and graphene nanoplatelates reinforced plasma sprayed alumina single splat: Experimental evidence by conductive atomic force microscopy

Ceramics International ◽

10.1016/j.ceramint.2020.06.243 ◽

2020 ◽

Vol 46 (15) ◽

pp. 24557-24563

Author(s):

Krishna Kant Pandey ◽

Ravi Kumar Singh ◽

OS Asiq Rahman ◽

Sumit Choudhary ◽

Rahul Verma ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Experimental Evidence ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Plasma Sprayed

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