Characterization of GeO2Sub-monolayers on SiO2Prepared by Chemical Vapor Deposition of Ge(OMe)4by EXAFS, FT-IR, and XRD
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2002 ◽
Vol 20
(3)
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pp. 828
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2007 ◽
Vol 46
(4A)
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pp. 1415-1426
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