Thermally Stable Antireflective Coatings Based on Nanoporous Organosilicate Thin Films

Langmuir ◽  
2007 ◽  
Vol 23 (12) ◽  
pp. 6737-6743 ◽  
Author(s):  
Suhan Kim ◽  
Jinhan Cho ◽  
Kookheon Char
Keyword(s):  
Thin Films ◽  
Thermally Stable ◽  
Antireflective Coatings ◽  
Organosilicate Thin Films

CONDUCTIVE COPPER SULFIDE THIN FILMS ON POLYIMIDE FOILS FOR OPTICAL AND OPTOELECTRONIC APPLICATIONS

2001 ◽  
Vol 15 (17n19) ◽  
pp. 774-777 ◽  
Author(s):  
J. CARDOSO ◽  
O. GOMEZ-DAZA ◽  
L. IXTLILCO ◽  
M. T. S. NAIR ◽  
P. K. NAIR
Keyword(s):  
Thin Films ◽  
Sheet Resistance ◽  
Copper Sulfide ◽  
Optoelectronic Device ◽  
Infrared Reflectance ◽  
Thermally Stable ◽  
Conductive Coatings ◽  
Device Structures ◽  
Conductive Substrates ◽  
Optoelectronic Applications

Copper sulfide thin films of 75 nm and 100 nm thickness were coated on Kapton foils (PI) of 25 nm thickness by floating them on a chemical bath. The foils were annealed at 150°C-400°C in N 2 converting the coating from CuS to Cu 1.8 S . The sheet resistance of the annealed coatings (100 nm) is 10-50 ohms/square which is almost unaltered after immersion in dilute HCl for 30-120 min. The infrared reflectance predicted for the coatings is 67%-77% at a wavelength 2.5 μm, which is nearly what is experimentally observed. The coated PI has a transmittance (25-35%) peak located around 550-600 nm. These thermally stable conductive coatings on PI foils might be used as conductive substrates for optoelectronic device structures.

Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering

2009 ◽  
Vol 113 (38) ◽  
pp. 12623-12627 ◽  
Author(s):  
Hong-Ji Chen ◽  
Sheng-Ying Li ◽  
Xiao-Jun Liu ◽  
Rui-Peng Li ◽  
Detlef-M. Smilgies ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Pore Structures ◽  
Organosilicate Thin Films ◽  
Ray Scattering

Optical properties of hydrophobic ZnO nano-structure based on antireflective coatings of ZnO/TiO/SiO thin films ‏

2020 ◽  
Vol 593 ◽  
pp. 412263 ◽  
Author(s):  
Ahmad A. Ahmad ◽  
Qais M. Al-Bataineh ◽  
Ahmad M. Alsaad ◽  
Tariq O. Samara ◽  
Kholoud A. Al-izzy
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Antireflective Coatings ◽  
Nano Structure

Oriented Mesoporous Organosilicate Thin Films

Nano Letters ◽  
2005 ◽  
Vol 5 (10) ◽  
pp. 2014-2018 ◽  
Author(s):  
Erik M. Freer ◽  
Leslie E. Krupp ◽  
William D. Hinsberg ◽  
Philip M. Rice ◽  
James L. Hedrick ◽  
...  
Keyword(s):  
Thin Films ◽  
Organosilicate Thin Films

Study of viscoplastic deformation in porous organosilicate thin films for ultra low-k applications

2013 ◽  
Vol 102 (22) ◽  
pp. 221909 ◽  
Author(s):  
Emil H. Zin ◽  
W. H. Bang ◽  
E. Todd Ryan ◽  
Sean W. King ◽  
Choong-Un Kim
Keyword(s):  
Thin Films ◽  
Viscoplastic Deformation ◽  
Organosilicate Thin Films ◽  
Low K

Sol-Gel Synthesis of thin Films for use as Planar Waveguides

1990 ◽  
Vol 180 ◽  
Author(s):  
G.W. Dale ◽  
H.H. Fox ◽  
Brian J.J. Zelinski ◽  
Laura Weller-Brophy
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Sol Gel ◽  
Planar Waveguides ◽  
Antireflective Coatings ◽  
Synthesis Techniques ◽  
Prism Coupler ◽  
University Of Arizona ◽  
The University ◽  
Sol Gel Synthesis

SiO2-TiO2 sol-gel solutions and synthesis techniques have been developed to produce thin films of proper index, thickness and quality for use as planar waveguides. The composition of the synthesized films ranged from 50 to 68 mole % TiO2 and produced layers with indices ranging from 1.7 to 1.8. Final film thicknesses ranged from 1000 to 3000 A and varied as a function of the coating chemistry and conditions. Also, changes in film shrinkage and index with heat treatment were determined and compared to literature data on similar films used as antireflective coatings. Finally, confirmation of the waveguiding qualities of these films was made through prism coupler measurements conducted by the University of Arizona Optical Sciences Center.

Scattering Studies of Nanoporous Organosilicate Thin Films Imprinted with Reactive Star Porogens

2005 ◽  
Vol 38 (22) ◽  
pp. 8991-8995 ◽  
Author(s):  
B. Lee ◽  
W. Oh ◽  
J. Yoon ◽  
Y. Hwang ◽  
J. Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Organosilicate Thin Films

scholarly journals Synchrotron X-ray reflectivity studies of nanoporous organosilicate thin films with low dielectric constants

2006 ◽  
Vol 40 (s1) ◽  
pp. s626-s630 ◽  
Author(s):  
Weontae Oh ◽  
Yongtaek Hwang ◽  
Tae Joo Shin ◽  
Byeongdu Lee ◽  
Jong-Seong Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Constants ◽  
X Ray ◽  
Low Dielectric ◽  
Organosilicate Thin Films

a-SiCxNy:H thin films for applications in solar cells as passivation and antireflective coatings

2016 ◽  
Author(s):  
Barbara Swatowska ◽  
Stanisława Kluska ◽  
Gabriela Lewińska ◽  
Julia Golańska ◽  
Tomasz Stapiński
Keyword(s):  
Thin Films ◽  
Solar Cells ◽  
Antireflective Coatings
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