scholarly journals Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

2016 ◽  
Vol 3 (10) ◽  
pp. 160248 ◽  
Author(s):  
X. Jin ◽  
B. Kasal
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Wood Surface ◽  
Adhesion Force ◽  
Data Interpretation ◽  
Natural Fibre ◽  
Force Distribution ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

scholarly journals Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

Atmosphere ◽  
2020 ◽  
Vol 11 (5) ◽  
pp. 489
Author(s):  
Kohei Ono ◽  
Yuki Mizushima ◽  
Masaki Furuya ◽  
Ryota Kunihisa ◽  
Nozomu Tsuchiya ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Aerosol Particles ◽  
Sea Salt ◽  
Dust Particles ◽  
Adhesion Forces ◽  
Distance Curve ◽  
Ambient Particles ◽  
Force Microscopy ◽  
Atomic Force

A new method, namely, force–distance curve mapping, was developed to directly measure the adhesion force of individual aerosol particles by atomic force microscopy. The proposed method collects adhesion force from multiple points on a single particle. It also takes into account the spatial distribution of the adhesion force affected by topography (e.g., the variation in the tip angle relative to the surface, as well as the force imposed upon contact), thereby enabling the direct and quantitative measurement of the adhesion force representing each particle. The topographic effect was first evaluated by measuring Polystyrene latex (PSL) standard particles, and the optimized method was then applied on atmospherically relevant model dust particles (quartz, ATD, and CJ-1) and inorganic particles (ammonium sulfate and artificial sea salt) to inter-compare the adhesion forces among different aerosol types. The method was further applied on the actual ambient aerosol particles collected on the western coast of Japan, when the region was under the influence of Asian dust plume. The ambient particles were classified into sea salt (SS), silicate dust, and Ca-rich dust particles based on individual particle analysis (micro-Raman or Scanning Electron Microscope/Energy Dispersive X-ray Spectroscopy (SEM-EDX)). Comparable adhesion forces were obtained from the model and ambient particles for both SS and silicate dust. Although dust particles tended to show smaller adhesion forces, the adhesion force of Ca-rich dust particles was larger than the majority of silicate dust particles and was comparable with the inorganic salt particles. These results highlight that the original chemical composition, as well as the aging process in the atmosphere, can create significant variation in the adhesion force among individual particles. This study demonstrates that force–distance curve mapping can be used as a new tool to quantitatively characterize the physical properties of aerosol particles on an individual basis.

scholarly journals Influence of Surface Properties on Adhesion Forces and Attachment ofStreptococcus mutansto ZirconiaIn Vitro

2016 ◽  
Vol 2016 ◽  
pp. 1-10 ◽  
Author(s):  
Pei Yu ◽  
Chuanyong Wang ◽  
Jinglin Zhou ◽  
Li Jiang ◽  
Jing Xue ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Surface Properties ◽  
Biofilm Formation ◽  
Adhesion Force ◽  
Contact Angles ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Early Attachment ◽  
Atomic Force ◽  
Initial Adhesion

Zirconia is becoming a prevalent material in dentistry. However, any foreign bodies inserted may provide new niches for the bacteria in oral cavity. The object of this study was to explore the effect of surface properties including surface roughness and hydrophobicity on the adhesion and biofilm formation ofStreptococcus mutans(S. mutans) to zirconia. Atomic force microscopy was employed to determine the zirconia surface morphology and the adhesion forces between theS. mutansand zirconia. The results showed that the surface roughness was nanoscale and significantly different among tested groups (P<0.05): Coarse (23.94±2.52 nm) > Medium (17.00±3.81 nm) > Fine (11.89±1.68 nm). The contact angles of the Coarse group were the highest, followed by the Medium and the Fine groups. Increasing the surface roughness and hydrophobicity resulted in an increase of adhesion forces and early attachment (2 h and 4 h) ofS. mutanson the zirconia but no influence on the further development of biofilm (6 h~24 h). Our findings suggest that the surface roughness in nanoscale and hydrophobicity of zirconia had influence on theS. mutansinitial adhesion force and early attachment instead of whole stages of biofilm formation.

Capillary Forces Studied with Atomic Force Microscopy

2007 ◽  
Vol 1025 ◽  
Author(s):  
Sahar Maghsoudy-Louyeh ◽  
Bernhard R. Tittmann
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Theoretical Calculations ◽  
Capillary Forces ◽  
Adhesion Forces ◽  
Coating Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Repulsive Forces ◽  
Hydrophilic Materials

AbstractThe deposition of films and coatings is sometimes influenced by the presence of small amounts of moisture, which can affect the nucleation and growth processes. It is important to understand the behavior of coating materials–especially in semiconductors–in terms of hydrophilicity/hydrophobicity along with adhesion forces. Our technical approach centers on the use of the atomic force microscope (AFM) which was found to be a reliable tool for studying the surface characteristics of materials. In addition to obtaining topographic information, the AFM can also probe attractive or repulsive forces between the tip and the sample surfaces. In this research, a systematic study of the influence of humidity on the adhesion forces between different AFM tips (silicon and silicon nitride) and both hydrophilic and hydrophobic materials (quartz, calcite, mica, graphite) has been conducted using atomic force microscopy. Several force-distance curves measured by the M5 AFM have been gathered at a series of different humidity levels and different locations on the samples. In this paper, measurements of the adhesion force for hydrophobic and hydrophilic materials versus humidity are presented. The results show that the adhesion force on graphite which has hydrophobic character is independent of humidity variation. Results also show that the adhesion force for fused quartz, mica, and calcite which are hydrophilic materials, change dramatically with increasing humidity due to capillary forces. This is in good agreement with theoretical calculations.

scholarly journals Shale adhesion force measurements via atomic force microscopy

2021 ◽  
Vol 76 ◽  
pp. 73
Author(s):  
Nikolai Mitiurev ◽  
Michael Verrall ◽  
Svetlana Shilobreeva ◽  
Alireza Keshavarz ◽  
Stefan Iglauer
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Force Measurement ◽  
Sample Surface ◽  
Wettability Alteration ◽  
Rock Surface ◽  
United States Bureau ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates of a reservoir. The discovery of wettability alteration in reservoirs, as well as complications that occur in analysis of heterogeneous sample, such as shale, for instance, have prompted scientists to look for the methods of wettability assessment at nanoscale. At the same time, bulk techniques, which are commonly applied, such as USBM (United States Bureau of Mines) or Amott tests, are not sensitive enough in cases with mixed wettability of rocks as they provide average wettability values of a core plug. Atomic Force Microscopy (AFM) has been identified as one of the methods that allow for measurement of adhesion forces between cantilever and sample surface in an exact location at nanoscale. These adhesion forces can be used to estimate wettability locally. Current research, however, shows that the correlation is not trivial. Moreover, adhesion force measurement via AFM has not been used extensively in studies with geological samples yet. In this study, the adhesion force values of the cantilever tip interaction with quartz inclusion on the shale sample surface, have been measured using the AFM technique. The adhesion force measured in this particular case was equal to the capillary force of water meniscus, formed between the sample surface and the cantilever tip. Experiments were conducted with a SiconG cantilever with (tip radius of 5 nm). The adhesion forces between quartz grain and cantilever tip were equal to 56.5 ± 5 nN. Assuming the surface of interaction to be half spherical, the adhesion force per area was 0.36 ± 0.03 nN/nm2. These measurements and results acquired at nano-scale will thus create a path towards much higher accuracy-wettability measurements and consequently better reservoir-scale predictions and improved underground operations.

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

scholarly journals Assessing the Functional Properties of TiZr Nanotubular Structures for Biomedical Applications, through Nano-Scratch Tests and Adhesion Force Maps

Molecules ◽  
2021 ◽  
Vol 26 (4) ◽  
pp. 900
Author(s):  
Maria Vardaki ◽  
Aida Pantazi ◽  
Ioana Demetrescu ◽  
Marius Enachescu
Keyword(s):  
Surface Roughness ◽  
Functional Properties ◽  
Bacterial Adhesion ◽  
Biomedical Applications ◽  
Adhesion Force ◽  
Roughness Parameters ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Scratch Tests

In this work we present the results of a functional properties assessment via Atomic Force Microscopy (AFM)-based surface morphology, surface roughness, nano-scratch tests and adhesion force maps of TiZr-based nanotubular structures. The nanostructures have been electrochemically prepared in a glycerin + 15 vol.% H2O + 0.2 M NH4F electrolyte. The AFM topography images confirmed the successful preparation of the nanotubular coatings. The Root Mean Square (RMS) and average (Ra) roughness parameters increased after anodizing, while the mean adhesion force value decreased. The prepared nanocoatings exhibited a smaller mean scratch hardness value compared to the un-coated TiZr. However, the mean hardness (H) values of the coatings highlight their potential in having reliable mechanical resistances, which along with the significant increase of the surface roughness parameters, which could help in improving the osseointegration, and also with the important decrease of the mean adhesion force, which could lead to a reduction in bacterial adhesion, are providing the nanostructures with a great potential to be used as a better alternative for Ti implants in dentistry.

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

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