The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations

Ayhan Yurtsever; Delia Fernández-Torre; Jo Onoda; Masayuki Abe; Seizo Morita; Yoshiaki Sugimoto; Rubén Pérez

doi:10.1039/c6nr07550a

The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations

Nanoscale ◽

10.1039/c6nr07550a ◽

2017 ◽

Vol 9 (18) ◽

pp. 5812-5821 ◽

Cited By ~ 10

Author(s):

Ayhan Yurtsever ◽

Delia Fernández-Torre ◽

Jo Onoda ◽

Masayuki Abe ◽

Seizo Morita ◽

...

Keyword(s):

Electronic Properties ◽

First Principles ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Electronic Properties of Doped Molecular Thin Films Measured by Kelvin Probe Force Microscopy†

The Journal of Physical Chemistry B ◽

10.1021/jp065246q ◽

2006 ◽

Vol 110 (50) ◽

pp. 25521-25524 ◽

Cited By ~ 18

Author(s):

O. Tal ◽

Y. Rosenwaks

Keyword(s):

Thin Films ◽

Electronic Properties ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Molecular Thin Films

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Electronic properties of dioctylterthiophene-based organic thin-film transistors: A Kelvin probe force microscopy study

Thin Solid Films ◽

10.1016/j.tsf.2013.04.010 ◽

2013 ◽

Vol 536 ◽

pp. 295-301 ◽

Cited By ~ 4

Author(s):

N. Afsharimani ◽

B. Nysten

Keyword(s):

Thin Film ◽

Electronic Properties ◽

Thin Film Transistors ◽

Microscopy Study ◽

Organic Thin Film Transistors ◽

Kelvin Probe Force Microscopy ◽

Organic Thin Film ◽

Kelvin Probe ◽

Force Microscopy

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Effect of grain boundary on nanoscale electronic properties of hydrogenated nanocrystalline silicon studied by Kelvin probe force microscopy

10.1117/12.2005367 ◽

2013 ◽

Author(s):

Rubana B. Priti ◽

Sandeep Mahat ◽

Venkat Bommisetty

Keyword(s):

Grain Boundary ◽

Electronic Properties ◽

Nanocrystalline Silicon ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Nanoscale Structural and Electronic Properties of Ultrathin Blends of Two Polyaromatic Molecules: A Kelvin Probe Force Microscopy Investigation

ChemPhysChem ◽

10.1002/cphc.200500480 ◽

2006 ◽

Vol 7 (4) ◽

pp. 847-853 ◽

Cited By ~ 10

Author(s):

Vincenzo Palermo ◽

Susanna Morelli ◽

Matteo Palma ◽

Christopher Simpson ◽

Fabian Nolde ◽

...

Keyword(s):

Electronic Properties ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Microscopy Investigation ◽

Structural And Electronic Properties

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

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Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/27/20/205703 ◽

2016 ◽

Vol 27 (20) ◽

pp. 205703 ◽

Cited By ~ 3

Author(s):

F Emmerich ◽

C Thielemann

Keyword(s):

Potential Distribution ◽

Real Space ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Space Measurement

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Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/14/145705 ◽

2008 ◽

Vol 19 (14) ◽

pp. 145705 ◽

Cited By ~ 26

Author(s):

Th Glatzel ◽

M Rusu ◽

S Sadewasser ◽

M Ch Lux-Steiner

Keyword(s):

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

Microelectronic Engineering ◽

10.1016/j.mee.2016.02.046 ◽

2016 ◽

Vol 157 ◽

pp. 71-77 ◽

Cited By ~ 1

Author(s):

Krzysztof Gajewski ◽

Witold Szymański ◽

Piotr Niedzielski ◽

Teodor Gotszalk

Keyword(s):

High Strength ◽

Kelvin Probe Force Microscopy ◽

Low Density Polyethylene ◽

Low Density ◽

Kelvin Probe ◽

Force Microscopy

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