Observation of Single-Crystal-Type EPR Spectra from Monolayers of Copper-Exchanged Zeolite Na-A Crystals Assembled on Glass Plates

2003 ◽  
Vol 107 (33) ◽  
pp. 8281-8284 ◽  
Author(s):  
Hyunsoo So ◽  
Kwang Ha ◽  
Yun-Jo Lee ◽  
Kyung Byung Yoon ◽  
R. Linn Belford
1984 ◽  
Vol 23 (10) ◽  
pp. 1326-1330 ◽  
Author(s):  
Reddy Damoder ◽  
Kundalika M. More ◽  
Gareth R. Eaton ◽  
Sandra S. Eaton

1985 ◽  
Vol 24 (24) ◽  
pp. 4009-4012 ◽  
Author(s):  
H. Drulis ◽  
K. Dyrek ◽  
K. P. Hoffmann ◽  
Stanislaw K. Hoffmann ◽  
A. Weselucha-Birczynska

1987 ◽  
Vol 91 ◽  
Author(s):  
R. T. Tung ◽  
F. Hellman ◽  
J. M. Gibson ◽  
T. Boone

ABSTRACTSingle crystal type A and type B CoxNi1-xSi2 layers have been grown on Si(111) by deposition of Co-Ni alloy in UHV and annealing. The dependence of CoxNi1-xSi2 layer orientation on the thickness of deposited metal is similar to that observed for pure nickel reaction. Silicon deposition along with the Co-Ni alloy allows the growth of type B oriented CoxNi1-xSi2. Auger, LEED, RBS and TEM analyses suggest that the composition of the ternary silicide layers is inhomogeneous. The advantages and disadvantages of this material in device application will be briefly discussed.


2015 ◽  
Vol 4 (12) ◽  
pp. P468-P475 ◽  
Author(s):  
Akihisa Kubota ◽  
Yuta Hatasako ◽  
Takahiro Takita ◽  
Mutsumi Touge

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